Properties of HgCdTe films obtained by laser deposition on a sapphire

• Published in: Applied surface science Vol. 177; no. 3; pp. 201 - 206
• Main Authors: Virt, I.S, Bester, M, Dumański, Ł, Kuźma, M, Rudyj, I.O, Frugynskyi, M.S, Kurilo, I.V
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 08.06.2001; Elsevier Science
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport phenomena in thin films and low-dimensional structures; Exact sciences and technology; HgCdTe; Laser deposition; Low-field transport and mobility; piezoresistance; Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Physics; Pulsed laser deposition; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Thin solid films; HgCdTe; Pulsed laser deposition; Thin solid films; Temperature dependence; Inorganic compounds; Semiconductor materials; Ternary compounds; Transition element compounds; Magnetic field effects; Hall effect; Experimental study; Substrates; Thin films; Cadmium tellurides; Morphology; Mercury tellurides; SEM
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/S0169-4332(01)00232-X

Films of HgCdTe have been obtained by pulsed laser deposition (PLD) using: Nd:YAG pulse laser (40 ns, 1 J/pulse, λ=1.06 μm) and XeCl excimer laser (25 ns, 150 mJ/pulse, λ=0.308 μm). Layers were deposited on monocrystalline and amorphous surfaces of Al 2O 3. Samples were obtained when the substrate temperature was 300 and 500 K. Monocrystalline Hg 1− x Cd x Te ( x=0.2) were used as a target. A thickness of layers obtained was in the range of 0.05–0.5 μm, depending on a type of laser used and on a number of shots. Surface morphology was investigated by electron scanning microscopy. The chemical composition of layers was determined by X-ray micro-analyses. The samples obtained were of good homogeneity and they reflected well the composition of the target. The structural properties of the samples were compared with results of the electrophysical measurements.