Tapping mode scanning force microscopy in water using a carbon nanotube probe

• Published in: Ultramicroscopy Vol. 80; no. 4; pp. 237 - 246
• Main Authors: Moloni, Katerina, Buss, Michael R, Andres, Ronald P
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.12.1999; Elsevier Science
• Subjects: AFM; Atomic force microscopes; Carbon nanotube; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Physics; Scanning probe microscopes, components and techniques; SPM; Tapping mode; Carbon nanotube; AFM; Tapping mode; SPM; 018; Atomic force microscopy; Microscope tips; Scanning probe microscopy; Nanotubes; Liquid phase; Experimental study; Carbon
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/S0304-3991(99)00107-2

An improved technique for obtaining tapping mode scanning force microscopy (TMSFM) images of soft samples submerged in water is described. This technique makes use of a carbon nanotube several microns in length mounted on a conventional silicon cantilever as the TMSFM probe. The sample is covered by a shallow water layer and during imaging only a portion of the nanotube is submerged. This mode of operation largely eliminates the undesirable effects of hydrodynamic damping and acoustic excitation that are present during conventional tapping mode operation in liquids and leads to high-quality TMSFM images. Because of their low bending force constants, carbon nanotubes are ideal for gentle imaging of soft samples. Because of their small (5–20 nm) diameter and cylindrical shape they provide excellent lateral resolution and are ideal for scanning high aspect ratio objects.