An objective approach for deriving surface structure: Application to Cu(100)/N

• Published in: Solid state communications Vol. 21; no. 1; pp. 5 - 8
• Main Authors: Kleiman, G.G., Burkstrand, J.M.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 1977
• ISSN: 0038-1098; 1879-2766
• DOI: 10.1016/0038-1098(77)91466-1

We describe an approach for determining surface geometry from data-averaged experimental intensity profiles. All periodic experimental peaks are treated statistically, so that uncertainties in a few peaks have a small effect. Application of this method to Cu(100) yields results in agreement with more conventional treatments. Results for Cu(100)/N indicate that the nitrogen rests 0.146 ± 0.005 nm above the Cu substrate with registry corresponding to the center of a copper unit cell.