Cantilever's behavior in the AC mode of an AFM

• Published in: Materials characterization Vol. 50; no. 2; pp. 173 - 177
• Main Authors: Nunes, V.B., Zanette, S.I., Caride, A.O., Prioli, R., Rivas, A.M.F.
• Format: Journal Article
• Language: English
• Published: United States Elsevier Inc 01.03.2003
• Subjects: AFM; ATOMIC FORCE MICROSCOPY; CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; FLEXIBILITY; LAYERS; Stiffness; THICKNESS; Thin film; THIN FILMS; AFM; Stiffness; Thin film

In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence—from noncontact to tapping operating mode—on the height of the contamination layer and on the st...