Cantilever's behavior in the AC mode of an AFM

In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence—from noncontact to tapping operating mode—on the height of the contamination layer and on the st...

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Bibliographic Details
Published inMaterials characterization Vol. 50; no. 2; pp. 173 - 177
Main Authors Nunes, V.B., Zanette, S.I., Caride, A.O., Prioli, R., Rivas, A.M.F.
Format Journal Article
LanguageEnglish
Published United States Elsevier Inc 01.03.2003
Subjects
AFM
ATOMIC FORCE MICROSCOPY
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
FLEXIBILITY
LAYERS
Stiffness
THICKNESS
Thin film
THIN FILMS
AFM
Stiffness
Thin film
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Summary:In this paper, a model with a small number of parameters is used to simulate the motion of a cantilever in the AC mode of an atomic force microscope (AFM). The results elucidate the transition dependence—from noncontact to tapping operating mode—on the height of the contamination layer and on the stiffness of the sample.
ISSN:1044-5803
1873-4189
DOI:10.1016/S1044-5803(03)00081-0