Magnetoresistance in sputtered Fe/Cr multilayer films

Polycrystalline Fe/Cr multilayer films were grown by sputter deposition. The as-grown films showed a mixture of ferromagnetic (FM) and antiferromagnetic (AF) coupling, with an unusually small magnetoresistance (MR) given the degree of AF coupling observed. Annealing for 1 h at 300°C increases the AF...

Full description

Saved in:
Bibliographic Details
Published inJournal of magnetism and magnetic materials Vol. 156; no. 1-3; pp. 65 - 66
Main Authors Ho, E.M., Petford-Long, A.K.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.04.1996
Online AccessGet full text

Cover

More Information
Summary:Polycrystalline Fe/Cr multilayer films were grown by sputter deposition. The as-grown films showed a mixture of ferromagnetic (FM) and antiferromagnetic (AF) coupling, with an unusually small magnetoresistance (MR) given the degree of AF coupling observed. Annealing for 1 h at 300°C increases the AF component, and the MR increases accordingly. Annealing for one more hour, however, decreases the AF component again with a reduction of MR. Changes in microstructure observed on annealing suggest that interface roughness and pin holes in the film are key factors in determining the magnitude of the GMR effect.
Bibliography:SourceType-Scholarly Journals-2
ObjectType-Feature-2
ObjectType-Conference Paper-1
content type line 23
SourceType-Conference Papers & Proceedings-1
ObjectType-Article-3
ISSN:0304-8853
DOI:10.1016/0304-8853(95)00788-1