Time-resolved optical measurements of laser melting and rapid solidification on GeAl films

Time-resolved optical measurements have been performed on micron-sized laser irradiated areas of GeAl thin films. The results show that transmission transients are suitable to calculate kinetical parameters of the melting-solidification process and that reflectivity transients depend strongly on the...

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Bibliographic Details
Published inApplied surface science Vol. 43; no. 1-4; pp. 171 - 177
Main Authors Afonso, C.N., Solis, J., Catalina, F.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 02.12.1989
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Summary:Time-resolved optical measurements have been performed on micron-sized laser irradiated areas of GeAl thin films. The results show that transmission transients are suitable to calculate kinetical parameters of the melting-solidification process and that reflectivity transients depend strongly on the surface topography. In the present experimental conditions an amorphous phase together with an Al crystalline network is observed and an excellent agreement is found when comparing the calculated solidification parameters with the observed microstructures.
Bibliography:SourceType-Scholarly Journals-2
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ISSN:0169-4332
1873-5584
DOI:10.1016/0169-4332(89)90207-9