Time-resolved optical measurements of laser melting and rapid solidification on GeAl films
Time-resolved optical measurements have been performed on micron-sized laser irradiated areas of GeAl thin films. The results show that transmission transients are suitable to calculate kinetical parameters of the melting-solidification process and that reflectivity transients depend strongly on the...
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Published in | Applied surface science Vol. 43; no. 1-4; pp. 171 - 177 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
02.12.1989
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Online Access | Get full text |
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Summary: | Time-resolved optical measurements have been performed on micron-sized laser irradiated areas of GeAl thin films. The results show that transmission transients are suitable to calculate kinetical parameters of the melting-solidification process and that reflectivity transients depend strongly on the surface topography. In the present experimental conditions an amorphous phase together with an Al crystalline network is observed and an excellent agreement is found when comparing the calculated solidification parameters with the observed microstructures. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 |
ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/0169-4332(89)90207-9 |