Local surface conductivity mapping of single-layer graphene subject to low energy argon bombardment: Energy loss mechanism and defect induction efficiency

• Published in: Materials letters Vol. 256; p. 126638
• Main Authors: Basu, Tanmoy, Blaskovic, Milan, Tripathy, Sudhiranjan, Tian, Feng, Singh, Ranveer, Som, Tapobrata, Garaj, Slaven, Anton van Kan, Jeroen
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.12.2019; Elsevier BV
• Subjects: Argon; Argon ions; Atomic force microscopy; Defects; Energy; Energy dissipation; Fluence; Graphene; Ion beams; Ion bombardment; Ion irradiation; Mapping; Materials science; Nuclear energy; Nuclear engineering; Nuclear reactors; Power efficiency; Graphene; Ion irradiation; Defects

•Low energy Ar+ irradiation of graphene.•Calculation of defect induction efficiency in graphene.•Role of Sn and Se in defect formation.•Role of sputtering.•Conductive atomic force microscopy study.•Change in surface conductivity after ion irradiation. An ion-beam exposure can be applied to form defe...