Deep levels in α-irradiated p-type MOCVD GaAs
Irradiation of p-GaAs grown by low-pressure metal-organic chemical-vapor deposition (LP-MOCVD) with α-particles from the 241Am source has been performed at room temperature. At least seven radiation-induced deep-level defects at energy positions E v+0.09 eV, E v+0.11 eV, E v+0.16 eV, E v+0.24 eV, E...
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Published in | Physica. B, Condensed matter Vol. 401; pp. 503 - 506 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
15.12.2007
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Subjects | |
Online Access | Get full text |
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Summary: | Irradiation of p-GaAs grown by low-pressure metal-organic chemical-vapor deposition (LP-MOCVD) with α-particles from the
241Am source has been performed at room temperature. At least seven radiation-induced deep-level defects at energy positions
E
v+0.09
eV,
E
v+0.11
eV,
E
v+0.16
eV,
E
v+0.24
eV,
E
v+0.32
eV,
E
v+0.42
eV, and
E
v+0.77
eV were detected in the lower-half of the band gap, using deep-level transient spectroscopy (DLTS), while no radiation-induced defects were observed in the upper-half band gap (minority carrier injection spectrum). The DLTS signatures of the radiation-induced defects are compared with the previously reported defects introduced in α-irradiated p-GaAs grown by molecular beam epitaxy (MBE). It has been observed that while four of these deep levels are similar to those found in α-irradiated MBE grown p-GaAs, three levels at
E
v+0.32
eV,
E
v+0.42
eV, and
E
v+0.77
eV observed in our MOCVD material were not detected in MBE material. Data on the introduction rates and other characteristics of the radiation-induced defects are presented. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 |
ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/j.physb.2007.09.009 |