Total dose testing of a CMOS charged particle spectrometer

A first-generation CMOS Charged Particle Spectrometer chip was designed at JPL for flight on the STRV-2 spacecraft. These devices will collect electron and proton spectra in low Earth orbit as part of an experiment to demonstrate Active Pixel Sensor (APS) technology in space. This paper presents the...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 44; no. 6; pp. 1957 - 1964
Main Authors Hancock, B.R., Soli, G.A.
Format Journal Article
LanguageEnglish
Published IEEE 01.12.1997
Subjects
Circuits
CMOS technology
Detectors
Electrons
Protons
Sensor arrays
Space technology
Spectroscopy
Switches
Testing
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Summary:A first-generation CMOS Charged Particle Spectrometer chip was designed at JPL for flight on the STRV-2 spacecraft. These devices will collect electron and proton spectra in low Earth orbit as part of an experiment to demonstrate Active Pixel Sensor (APS) technology in space. This paper presents the results of total dose testing on these chips and, where possible, attempts to extend the results to other Active Pixel Sensors.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/23.658968