Highly transparent and conducting ITO/Ag/ITO multilayer thin films on FEP substrates for flexible electronics applications
Transparent and conducting ITO/Ag/ITO (IAI) multilayer coatings were deposited on glass and flexible fluorinated ethylene propylene (FEP) substrates by reactive sputtering using metallic In:Sn (90%:10%) and Ag targets at room temperature. Middle Ag layer thickness was optimized to obtain maximum fig...
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| Published in | Solar energy materials and solar cells Vol. 172; pp. 277 - 284 |
|---|---|
| Main Authors | , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Amsterdam
Elsevier B.V
01.12.2017
Elsevier BV |
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| Online Access | Get full text |
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| Abstract | Transparent and conducting ITO/Ag/ITO (IAI) multilayer coatings were deposited on glass and flexible fluorinated ethylene propylene (FEP) substrates by reactive sputtering using metallic In:Sn (90%:10%) and Ag targets at room temperature. Middle Ag layer thickness was optimized to obtain maximum figure of merit (ϕ) and the optimum Ag layer thickness was found to be ~13nm. The optimized IAI multilayer on glass substrate showed transmittance of ~88.6% and sheet resistance of ~7.1Ω/sq. The transmittance increased to ~91.4% for the IAI multilayer deposited on one side etched glass. The optimized IAI multilayer coating was also deposited on flexible FEP substrates. The electrical, optical, structural and morphological properties of IAI deposited on glass and FEP substrates were compared. IAI deposited on FEP substrate showed transmittance of ~90.2% at λ = 550nm, sheet resistance of ~6.9Ω/sq. and figure of merit of ~52 × 10−3Ω−1. Bending test of IAI deposited FEP proved the high flexibility of IAI multilayer for the flexible transparent electrode applications. Solar selectivity study of IAI on FEP substrate showed it can effectively reflect the higher wavelength region of solar spectrum and can be used as a flexible solar spectrum segregator. Optical haze measurements of IAI coated glass and FEP show that high haze value can be achieved by increasing the roughness on non-coated side of the FEP substrate.
•ITO/Ag/ITO multilayer thin films were deposited on glass and FEP substrates by sputtering.•Optical, electrical, structural and mechanical properties were studied in detail.•Optimized ITO coating on FEP exhibits T of ~91% and RS of 6.9Ω/sq.•Optical haze of IAI/FEP can be tuned by etching the substrate. |
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| AbstractList | Transparent and conducting ITO/Ag/ITO (IAI) multilayer coatings were deposited on glass and flexible fluorinated ethylene propylene (FEP) substrates by reactive sputtering using metallic In:Sn (90%:10%) and Ag targets at room temperature. Middle Ag layer thickness was optimized to obtain maximum figure of merit (ϕ) and the optimum Ag layer thickness was found to be ~13nm. The optimized IAI multilayer on glass substrate showed transmittance of ~88.6% and sheet resistance of ~7.1Ω/sq. The transmittance increased to ~91.4% for the IAI multilayer deposited on one side etched glass. The optimized IAI multilayer coating was also deposited on flexible FEP substrates. The electrical, optical, structural and morphological properties of IAI deposited on glass and FEP substrates were compared. IAI deposited on FEP substrate showed transmittance of ~90.2% at λ = 550nm, sheet resistance of ~6.9Ω/sq. and figure of merit of ~52 × 10−3Ω−1. Bending test of IAI deposited FEP proved the high flexibility of IAI multilayer for the flexible transparent electrode applications. Solar selectivity study of IAI on FEP substrate showed it can effectively reflect the higher wavelength region of solar spectrum and can be used as a flexible solar spectrum segregator. Optical haze measurements of IAI coated glass and FEP show that high haze value can be achieved by increasing the roughness on non-coated side of the FEP substrate.
•ITO/Ag/ITO multilayer thin films were deposited on glass and FEP substrates by sputtering.•Optical, electrical, structural and mechanical properties were studied in detail.•Optimized ITO coating on FEP exhibits T of ~91% and RS of 6.9Ω/sq.•Optical haze of IAI/FEP can be tuned by etching the substrate. Transparent and conducting ITO/Ag/ITO (IAI) multilayer coatings were deposited on glass and flexible fluorinated ethylene propylene (FEP) substrates by reactive sputtering using metallic In:Sn (90%:10%) and Ag targets at room temperature. Middle Ag layer thickness was optimized to obtain maximum figure of meritΦand the optimum Ag layer thickness was found to be ~13 nm. The optimized IAI multilayer on glass substrate showed transmittance of ~88.6% and sheet resistance of ~7.1 O/sq. The transmittance increased to ~91.4% for the IAI multilayer deposited on one side etched glass. The optimized IAI multilayer coating was also deposited on flexible FEP substrates. The electrical, optical, structural and morphological properties of IAI deposited on glass and FEP substrates were compared. IAI deposited on FEP substrate showed transmittance of ~90.2% at λ = 550 nm, sheet resistance of ~6.9 Ω/sq. and figure of merit of~52 x 10-3 Ω-1. Bending test of IAI deposited FEP proved the high flexibility of IAI multilayer for the flexible transparent electrode applications. Solar selectivity study of IAI on FEP substrate showed it can effectively reflect the higher wavelength region of solar spectrum and can be used as a flexible solar spectrum segregator. Optical haze measurements of IAI coated glass and FEP show that high haze value can be achieved by increasing the roughness on non-coated side of the FEP substrate. |
| Author | Dey, Arjun Sridhara, N. Shashikala, H.D. Kumar Sharma, Anand Sibin, K.P. Barshilia, Harish C. Srinivas, G. |
| Author_xml | – sequence: 1 givenname: K.P. surname: Sibin fullname: Sibin, K.P. organization: Nanomaterials Research Laboratory, Surface Engineering Division, CSIR-National Aerospace Laboratories, Bangalore 560017, India – sequence: 2 givenname: G. surname: Srinivas fullname: Srinivas, G. organization: Nanomaterials Research Laboratory, Surface Engineering Division, CSIR-National Aerospace Laboratories, Bangalore 560017, India – sequence: 3 givenname: H.D. surname: Shashikala fullname: Shashikala, H.D. organization: Department of Physics, National Institute of Technology Karnataka, Surathkal, Mangalore 575025, India – sequence: 4 givenname: Arjun surname: Dey fullname: Dey, Arjun organization: ISRO Satellite Centre, Bangalore 560017, India – sequence: 5 givenname: N. surname: Sridhara fullname: Sridhara, N. organization: ISRO Satellite Centre, Bangalore 560017, India – sequence: 6 givenname: Anand surname: Kumar Sharma fullname: Kumar Sharma, Anand organization: ISRO Satellite Centre, Bangalore 560017, India – sequence: 7 givenname: Harish C. surname: Barshilia fullname: Barshilia, Harish C. email: harish@nal.res.in organization: Nanomaterials Research Laboratory, Surface Engineering Division, CSIR-National Aerospace Laboratories, Bangalore 560017, India |
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| SubjectTerms | Chemical reactions Electrical resistivity FEP substrate Figure of merit Flexible components Flexible transparent conductors Fluorinated ethylene propylenes Glass substrates Haze ITO/Ag/ITO multilayer Optical properties Selectivity Silver Solar energy Spectrum analysis Studies Substrates Thickness Thin films Tin Transmittance Wavelet transforms |
| Title | Highly transparent and conducting ITO/Ag/ITO multilayer thin films on FEP substrates for flexible electronics applications |
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