Characterization of UV written waveguides with luminescence microscopy

• Published in: Optics express Vol. 13; no. 13; pp. 5170 - 5178
• Main Authors: Svalgaard, Mikael, Harpøth, Anders, Rosbirk, Tue
• Format: Journal Article
• Language: English
• Published: United States 27.06.2005

Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 ?m and high signal-to-noise ratio. The measurements reveal complex waveguide formation dynamics with significant topological changes in...