Characterization of UV written waveguides with luminescence microscopy

Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 ?m and high signal-to-noise ratio. The measurements reveal complex waveguide formation dynamics with significant topological changes in...

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Bibliographic Details
Published inOptics express Vol. 13; no. 13; pp. 5170 - 5178
Main Authors Svalgaard, Mikael, Harpøth, Anders, Rosbirk, Tue
Format Journal Article
LanguageEnglish
Published United States 27.06.2005
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Summary:Luminescence microscopy is used to measure the refractive index profile and molecular defect distribution of UV written waveguides with a spatial resolution of ~0.4 ?m and high signal-to-noise ratio. The measurements reveal complex waveguide formation dynamics with significant topological changes in the core profile. In addition, it is observed that the waveguide formation process requires several milliseconds of UV exposure before starting.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OPEX.13.005170