Sputtering of thin pyrite films

Argon and reactive ion beam sputtering of thin pyrite (FeS 2) and other iron sulfide films is reported. Films were characterized by X-ray diffraction, Rutherford backscattering, measurements of the temperature-dependent conductivity and optical spectroscopy.

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Bibliographic Details
Published inSolar energy materials and solar cells Vol. 27; no. 3; pp. 243 - 251
Main Authors Birkholz, M., Lichtenberger, D., Höpfner, C., Fiechter, S.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.08.1992
Elsevier
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Summary:Argon and reactive ion beam sputtering of thin pyrite (FeS 2) and other iron sulfide films is reported. Films were characterized by X-ray diffraction, Rutherford backscattering, measurements of the temperature-dependent conductivity and optical spectroscopy.
ISSN:0927-0248
1879-3398
DOI:10.1016/0927-0248(92)90086-5