Scanning probe microscopy of graphene

• Published in: Physica. E, Low-dimensional systems & nanostructures Vol. 44; no. 4; pp. 743 - 759
• Main Authors: Deshpande, Aparna, LeRoy, Brian J.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 2012; Elsevier
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Electron states and collective excitations in thin films, multilayers, quantum wells, mesoscopic and nanoscale systems; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Exact sciences and technology; Fullerenes and related materials; diamonds, graphite; Materials science; Physics; Specific materials; Electronic properties; Reviews; Scanning probe microscopy; Graphene; Carbon; Monolayers
• ISSN: 1386-9477
• DOI: 10.1016/j.physe.2011.11.024

A material with novel fundamental properties that challenge our current understanding is always exciting for research. If the novel properties extend to the realm of device engineering and promise a revolution in applications, then the scope of its research knows no bounds. The story of graphene, the two dimensional form of carbon, has followed this path. Graphene has been the subject of numerous experimental and theoretical investigations since 2004 when an elegant and a simple technique to make monolayer graphene set the stage for extensive research. Many other techniques to make graphene were developed in parallel to this technique. As graphene is replete with unique structural and electronic properties scanning probe microscopy has proved to be an exciting and a rewarding venture. In this review we discuss the findings of scanning probe microscopy and how it has served as an indispensable tool to understand the properties of graphene and further graphene research.