Preferable Parametric Model for the Lifetime of the Organic Light-Emitting Diode Under Accelerated Current Stress Tests

• Published in: IEEE transactions on electron devices Vol. 68; no. 9; pp. 4478 - 4484
• Main Authors: Kittaneh, Omar A., Helal, Sara, Almorad, Heba, Bayoud, Husam A., Abufoudeh, Ghassan, Majid, M. A.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.09.2021; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Accelerated life testing (ALT); Accelerated tests; efficiency of censored samples; Goodness of fit; goodness-of-fit (GoF) tests; inverse power law (IPL); Life estimation; lognormal distribution; maximum likelihood estimate (MLE); Maximum likelihood estimation; Optoelectronics; Organic light emitting diodes; organic light-emitting diode (OLED); Parametric statistics; Probability density function; Statistical analysis; Stress; Weibull distribution
• ISSN: 0018-9383; 1557-9646
• DOI: 10.1109/TED.2021.3097974

Usually, researchers adopt Weibull distribution as the best fitting lifetime model of several electronics/ optoelectronics devices, including organic light-emitting diodes (OLEDs). They justify the adoption based on a few statistical goodness-of-fit (GoF) tests, which are not always applicable due to violating some of the assumptions of the tests. In this article, several standard and valid GoF tests show that the lognormal distribution is a better fitting model than the Weibull distribution for OLEDs and performs better when a censoring scheme is applied.