Structural characterization of Au/Co multilayers by x-ray diffraction, x-ray reflectivity and glancing-incidence x-ray fluorescence

• Published in: Journal of magnetism and magnetic materials Vol. 121; no. 1; pp. 88 - 93
• Main Authors: v.d. Hoogenhof, W.W., Ryan, T.W.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.1993; Elsevier Science
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties; Metals. Metallurgy; Physics; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Gold; Roughness; Multiple layer; Fluorescence; Transition metal; X ray analysis; Cobalt; X ray diffraction; Reflectivity; Interface properties; Rocking curve; Interface; Standing wave; Magnetic properties
• ISSN: 0304-8853
• DOI: 10.1016/0304-8853(93)91156-2

The magnetic properties of metallic multilayers are strongly influenced by their structural properties, for example interface quality, parallelism of the atomic layers, the amount of strain in the material and the coherence over long distances. In this paper we discuss analysis of such materials in a non-destructive way by the use of glancing-incidence X-ray analysis (GIXA) and high-angle X-ray diffraction. The GIXA technique gives information on layer thicknesses and interface roughness (low-angle reflectivity), and on the flatness and parallelism on the interfaces (rocking curve). Standing wave X-ray fluorescence offers possibilities to measure composition as a function of depth on a nanometer scale and to define the fraction of the sample which is highly ordered. High-angle XRD can provide information on the crystalline properties of the sample. The “mosaicity” and epitaxial relationship between layer and substrate can be studied by parallel-beam reciprocal space mapping. Multilayer periodicity can be measured from high-angle diffraction (satellites). Lattice strain variation and mosaic spread can be quantified if more than one reflection is measured.