Phases in rapidly cooled scandium-silicon samples

Small, 0.5 g, samples of high purity ScSi compositions have been melted in an argon arc furnace and cooled at 150–200 °C s −1 while their surface temperatures have been monitored. From the cooling curves and microscopic, hardness, X-ray powder and differential thermal analyses, a phase diagram is s...

Full description

Saved in:
Bibliographic Details
Published inJournal of alloys and compounds Vol. 203; pp. 259 - 265
Main Authors Kotroczo, V., McColm, I.J.
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 04.01.1994
Elsevier
Subjects
Applied sciences
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Metals. Metallurgy
Phase diagrams and microstructures developed by solidification and solid-solid phase transformations
Phase diagrams of metals and alloys
Physics
Phase diagrams
Scandium silicides
X-ray diffraction
Binary systems
Differential thermal analysis
Phase analysis
Experimental study
Microhardness
Solidification
Temperature measurement
Binary alloys
Silicon alloys
Peritectic transformation
Rapidly solidified alloy
Microstructure
Scandium alloys
Online AccessGet full text

Cover

More Information
Summary:Small, 0.5 g, samples of high purity ScSi compositions have been melted in an argon arc furnace and cooled at 150–200 °C s −1 while their surface temperatures have been monitored. From the cooling curves and microscopic, hardness, X-ray powder and differential thermal analyses, a phase diagram is suggested which has many similarities to the most recently proposed phase diagram, but does contain evidence for a peritectically formed Sc 5Si 4 phase. The highest silicide is non-stoichiometric within the range ScSi 1.22-ScSi 1.67.
ISSN:0925-8388
1873-4669
DOI:10.1016/0925-8388(94)90744-7