Results of radiation hardness tests and performance tests of the HS9008RH flash ADC
Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance...
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Published in | IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41; no. 4; pp. 1197 - 1202 |
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Main Authors | , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
New York, NY
IEEE
01.08.1994
Institute of Electrical and Electronics Engineers |
Subjects | |
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Abstract | Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above a sampling rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV /spl gamma/ radiation from a /sup 60/Co source. Exposure of the device to a reactor fast neutron fluence (E>100 keV) of 5/spl times/10/sup 14//cm/sup 2/ resulted in no significant observed performance degradation as well.< > |
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AbstractList | Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above a sampling rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV gamma radiation from a (60)Co source. Exposure of the device to a reactor fast neutron fluence (E > 100 keV) of 5x10(14)/cm(2) resulted in no significant observed performance degradation as well Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital converter (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV [gamma] radiation from a [sup 60]Co source. Exposure of the device to a reactor fast neutron fluence (E > 100keV) of 5 [times] 10[sup 14]/cm[sup 2] resulted in no significant observed performance degradation as well. Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above a sampling rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV /spl gamma/ radiation from a /sup 60/Co source. Exposure of the device to a reactor fast neutron fluence (E>100 keV) of 5/spl times/10/sup 14//cm/sup 2/ resulted in no significant observed performance degradation as well.< > |
Author | Tarle, G. Crawley, H.B. Thomas, W.D. Nutter, S. Meyer, W.T. McKay, R. Rosenberg, E.I. |
Author_xml | – sequence: 1 givenname: S. surname: Nutter fullname: Nutter, S. organization: Dept. of Phys., Michigan Univ., Ann Arbor, MI, USA – sequence: 2 givenname: G. surname: Tarle fullname: Tarle, G. organization: Dept. of Phys., Michigan Univ., Ann Arbor, MI, USA – sequence: 3 givenname: H.B. surname: Crawley fullname: Crawley, H.B. – sequence: 4 givenname: R. surname: McKay fullname: McKay, R. – sequence: 5 givenname: W.T. surname: Meyer fullname: Meyer, W.T. – sequence: 6 givenname: E.I. surname: Rosenberg fullname: Rosenberg, E.I. – sequence: 7 givenname: W.D. surname: Thomas fullname: Thomas, W.D. |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3326976$$DView record in Pascal Francis https://www.osti.gov/biblio/7154388$$D View this record in Osti.gov |
BookMark | eNpFkM1rGzEQxUVJII7TQ649LaUUcthEnyvpGNymDgQCcXMWsnaEt6wlV7M-5L-Pwpr2NMy833sM75KcpZyAkGtGbxmj9o6LW8G5MeITWTClTMuUNmdkQSkzrZXWXpBLxD91lYqqBdm8AB7HCZscm-L7wU9DTs3Olz4BYjMBVs2nvjlAibnsfQpwulbHtINmvbGUmpd1E0ePu-b-x-qKnEc_Inw-zSV5ffj5e7Vun55_Pa7un9oghJhaTZVVHnoZg9x63oGlnFvLrFQS-thFbToNNASlBHTBQ7QyaEoDM1psNRVL8nXOzTgNDsMwQdiFnBKEyWmmpKg9LMn3GTqU_PdYH3f7AQOMo0-Qj-i4UVIxyyt4M4OhZMQC0R3KsPflzTHqPrp1XLi528p-O4V6DH6MpdYy4D-DELyzuqvYlxkbAOC_Ome8A4ipgDI |
CODEN | IETNAE |
CitedBy_id | crossref_primary_10_1016_S0951_8320_96_00054_3 |
Cites_doi | 10.1109/23.289280 10.1016/0168-9002(94)90289-5 10.1109/23.256650 10.1109/23.159706 |
ContentType | Journal Article Conference Proceeding |
Copyright | 1995 INIST-CNRS |
Copyright_xml | – notice: 1995 INIST-CNRS |
DBID | IQODW AAYXX CITATION 7U5 8FD L7M OTOTI |
DOI | 10.1109/23.322883 |
DatabaseName | Pascal-Francis CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace OSTI.GOV |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Solid State and Superconductivity Abstracts |
DatabaseTitleList | Technology Research Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics Applied Sciences |
EISSN | 1558-1578 |
EndPage | 1202 |
ExternalDocumentID | 7154388 10_1109_23_322883 3326976 322883 |
Genre | orig-research |
GroupedDBID | .DC .GJ 0R~ 29I 3O- 4.4 53G 5GY 5RE 5VS 6IK 8WZ 97E A6W AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT ACPRK AENEX AETEA AETIX AFRAH AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RIG RNS TAE TN5 VH1 VOH XFK ZA5 08R ABPTK IQODW AAYXX CITATION 7U5 8FD L7M OTOTI |
ID | FETCH-LOGICAL-c333t-70595aed4fc4ba26e90229919454edf6f7867e0cc553e6caef94c700c1873b703 |
IEDL.DBID | RIE |
ISSN | 0018-9499 |
IngestDate | Fri May 19 00:37:51 EDT 2023 Sat Aug 17 04:12:52 EDT 2024 Thu Sep 26 16:03:20 EDT 2024 Sun Oct 22 16:07:35 EDT 2023 Wed Jun 26 19:25:48 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 4 |
Keywords | Radiation resistance Flash converter AD converter Signal conversion |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | NSS-MIC '93 : 1993 nuclear science symposium and medical imaging conference |
MergedId | FETCHMERGED-LOGICAL-c333t-70595aed4fc4ba26e90229919454edf6f7867e0cc553e6caef94c700c1873b703 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 AC02-76ER01112 CONF-931051- |
PQID | 28545192 |
PQPubID | 23500 |
PageCount | 6 |
ParticipantIDs | pascalfrancis_primary_3326976 crossref_primary_10_1109_23_322883 ieee_primary_322883 proquest_miscellaneous_28545192 osti_scitechconnect_7154388 |
PublicationCentury | 1900 |
PublicationDate | 1994-08-01 |
PublicationDateYYYYMMDD | 1994-08-01 |
PublicationDate_xml | – month: 08 year: 1994 text: 1994-08-01 day: 01 |
PublicationDecade | 1990 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY – name: United States |
PublicationTitle | IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) |
PublicationTitleAbbrev | TNS |
PublicationYear | 1994 |
Publisher | IEEE Institute of Electrical and Electronics Engineers |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers |
References | (ref1) 0 (ref6) 1989 simpson (ref8) 0 ref4 ref3 grundl (ref7) 1992; 66 ref5 ref2 |
References_xml | – ident: ref3 doi: 10.1109/23.289280 – ident: ref2 doi: 10.1016/0168-9002(94)90289-5 – year: 1989 ident: ref6 publication-title: IEEE trial-use standard for digitizing waveform recorders – ident: ref5 doi: 10.1109/23.256650 – ident: ref4 doi: 10.1109/23.159706 – year: 0 ident: ref1 – volume: 66 start-page: 172 year: 1992 ident: ref7 publication-title: Trans American Nuclear Society 1992 Winter Meeting contributor: fullname: grundl – year: 0 ident: ref8 publication-title: Personal communication contributor: fullname: simpson |
SSID | ssj0014505 |
Score | 1.4730144 |
Snippet | Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests... Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital converter (FADC) are presented. These tests... |
SourceID | osti proquest crossref pascalfrancis ieee |
SourceType | Open Access Repository Aggregation Database Index Database Publisher |
StartPage | 1197 |
SubjectTerms | 430303 - Particle Accelerators- Experimental Facilities & Equipment 440104 - Radiation Instrumentation- High Energy Physics Instrumentation 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems Analog-digital conversion ANALOG-TO-DIGITAL CONVERTERS Applied sciences Circuit properties Degradation Electric, optical and optoelectronic circuits Electronic circuits ELECTRONIC EQUIPMENT Electronics Exact sciences and technology HARDENING INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Ionizing radiation Manufacturing processes MEASURING INSTRUMENTS Neutrons PARTICLE ACCELERATORS PARTICLE TRACKS Performance evaluation PERFORMANCE TESTING PHYSICAL RADIATION EFFECTS Physics RADIATION DETECTORS RADIATION EFFECTS RADIATION HARDENING Sampling methods Signal convertors STORAGE RINGS SUPERCONDUCTING SUPER COLLIDER TESTING |
Title | Results of radiation hardness tests and performance tests of the HS9008RH flash ADC |
URI | https://ieeexplore.ieee.org/document/322883 https://search.proquest.com/docview/28545192 https://www.osti.gov/biblio/7154388 |
Volume | 41 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1La9wwEB6SQKA9JOm2JZtXRenVG60kW_Jx2SQsgfSQdGFvRpIlCi32EtuX_PqMZG9e7SEnG9mysWak-eSZ-QbgR264MSXVCZpnmQhjfaK0zBPOTGamlgoXSyfc_MwWS3G9SlcDz3bMhXHOxeAzNwmn0Zdf1rYLv8rOUfmU4tuwrSjrU7WeHAYipUOxApy_iOIHEqEpzc8Zn_QdX5meWEsFDzXOpBAQqRscE98Xs_hnXY7G5mq_z-JuIkdhiDH5M-laM7EPbxgc3_kdB7A3gE4y67XkE2y5agQfX1ARjmA3hoLa5jPc3bqm-9s2pPbkPjAXBNGRkJwVVkWC0BSv6aok6-ecg6EVeyCeJIu7HG3-7YJ4hOa_yexi_gWWV5e_5otkKL2QWM55m0hEXal2pfBWGM0yl6OtRyiZi1S40mdeqkw6am2acpdZ7XwurKTUTpXkBleRr7BT1ZU7BOI1yl1IJTg-zqTCoMlkJfNlqRXznI3h-0Yqxbpn2CjizoTmBeNFP1ZjGIVhfLph03ocxFcgWAiMtzaEBtm2kKh3XKkxnL6S6nNnhKyIwsbwbSPlAudUcJToytVdU4SsUkS27Oi_bz2GDz2hcogCPIGd9r5zp4hMWnMWdfIROergHA |
link.rule.ids | 230,310,311,315,786,790,795,796,802,891,23958,23959,25170,27955,27956,55107 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Nb9QwEB1BUUU5AF1AXUqphXrN1ms7sXOsClWAtod-SL1ZtmOrEiipmuTCr2fsZFtaOHBKlMSJ4hn7vcQzbwD2SsutranJEJ5lJqwLmTKyzDizhV06KnwqnXByWlSX4ttVfjXpbKdcGO99Cj7zi7ib1vLr1g3xV9k-Op9S_Ck8Q5inckzWulsyEDmdyhXgCEYeP8kILWm5z_hibPoAfFI1Fdy0OJZiSKTpsFfCWM7ir5k5wc3RqzGPu0sqhTHK5Mdi6O3C_Xqk4fifb_IaXk60kxyMfrIJT3wzgxd_iBHOYD0Fg7ruDZyf-W742XekDeQ2ahdE45GYnhXnRYLkFM-ZpiY391kH01FsgYySVOclov5ZRQKS82ty8PnwLVwefbk4rLKp-ELmOOd9JpF35cbXIjhhDSt8iWiPZLIUufB1KIJUhfTUuTznvnDGh1I4SalbKsktziPvYK1pG78FJBi0vJBKcLydzYVF0GQ1C3VtFAuczeHTyir6ZtTY0OnbhJaacT321RxmsRvvLlgd3Y7m00gXouati8FBrtcSPY8rNYedB1a9b4ykFXnYHHZXVtY4quJSiWl8O3Q65pUit2Xv__nUXXheXZwc6-Ovp9-3YWOUV44xgR9grb8d_A7ylN5-TP75Gy5Z43A |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=IEEE+transactions+on+nuclear+science&rft.atitle=Results+of+radiation+hardness+tests+and+performance+tests+of+the+HS9008RH+flash+ADC&rft.au=NUTTER%2C+S&rft.au=TARLE%2C+G&rft.au=CRAWLEY%2C+H.+B&rft.au=MCKAY%2C+R&rft.date=1994-08-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=0018-9499&rft.eissn=1558-1578&rft.volume=41&rft.issue=4&rft.spage=1197&rft.epage=1202&rft_id=info:doi/10.1109%2F23.322883&rft.externalDBID=n%2Fa&rft.externalDocID=3326976 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9499&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9499&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9499&client=summon |