Results of radiation hardness tests and performance tests of the HS9008RH flash ADC

• Published in: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41; no. 4; pp. 1197 - 1202
• Main Authors: Nutter, S., Tarle, G., Crawley, H.B., McKay, R., Meyer, W.T., Rosenberg, E.I., Thomas, W.D.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.08.1994; Institute of Electrical and Electronics Engineers
• Subjects: 430303 - Particle Accelerators- Experimental Facilities & Equipment; 440104 - Radiation Instrumentation- High Energy Physics Instrumentation; 440200 - Radiation Effects on Instrument Components, Instruments, or Electronic Systems; Analog-digital conversion; ANALOG-TO-DIGITAL CONVERTERS; Applied sciences; Circuit properties; Degradation; Electric, optical and optoelectronic circuits; Electronic circuits; ELECTRONIC EQUIPMENT; Electronics; Exact sciences and technology; HARDENING; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Ionizing radiation; Manufacturing processes; MEASURING INSTRUMENTS; Neutrons; PARTICLE ACCELERATORS; PARTICLE TRACKS; Performance evaluation; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; Physics; RADIATION DETECTORS; RADIATION EFFECTS; RADIATION HARDENING; Sampling methods; Signal convertors; STORAGE RINGS; SUPERCONDUCTING SUPER COLLIDER; TESTING; Radiation resistance; Flash converter; AD converter; Signal conversion
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/23.322883

Results from tests characterizing the performance and radiation hardness of the HS9008RH flash analog to digital convertor (FADC) are presented. These tests were performed primarily to evaluate the suitability of this device for use in the GEM Central Tracker at the SSC experiment. Basic performance characteristics and susceptibility of these characteristics to radiation were examined. Performance test results indicate that the device integral nonlinearity is sampling rate dependent and worsens rapidly above a sampling rate of 15 megasamples per second (MSPS). No degradation in performance of the device was observed after its exposure of up to 81 Mrad of 1.25 MeV /spl gamma/ radiation from a /sup 60/Co source. Exposure of the device to a reactor fast neutron fluence (E>100 keV) of 5/spl times/10/sup 14//cm/sup 2/ resulted in no significant observed performance degradation as well.< >