Main magnetic focus ion source: Basic principles, theoretical predictions and experimental confirmations

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, extremely high electron current densities can be attained on short length of the ion trap. The design of very compact ion sources of the new ge...

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Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 370; pp. 32 - 41
Main Authors Ovsyannikov, V.P., Nefiodov, A.V.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.03.2016
Subjects
Computer simulation
Electron beams
Emission
Focusing
Highly charged ions
Ion source
Ion sources
Local ion trap
Magnetic fields
Magnetic focus
Pilots
Rippled electron beam
X-rays
Rippled electron beam
Magnetic focus
Local ion trap
Ion source
Highly charged ions
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Summary:It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, extremely high electron current densities can be attained on short length of the ion trap. The design of very compact ion sources of the new generation is presented. The computer simulations predict that for such ions as, for example, Ne8+ and Xe44+, the intensities of about 109 and 106 ions per second, respectively, can be obtained. The experiments with pilot example of the ion source confirm efficiency of the suggested method. The X-ray emission from Ir59+, Xe44+ and Ar16+ ions was detected. The control over depth of the local ion trap is shown to be feasible.
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ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2016.01.001