Present possibilities for the X-ray diffraction method of stress measurement

The principles and applications of the X-ray diffraction method of residual stress measurement are described, with particular regard to recent advances in theory and technology which have led to increased use of the method for the determination of both microstresses and macrostresses.

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Bibliographic Details
Published inNDT international Vol. 14; no. 5; pp. 235 - 247
Main Authors Maeder, G., Lebrun, J.L., Sprauel, J.M.
Format Journal Article
LanguageEnglish
Published Guildford Elsevier B.V 01.01.1981
Butterworth Scientific Limited
Subjects
Analysing. Testing. Standards
Applied sciences
Chemical and electrochemical properties
Exact sciences and technology
Measurement of properties and materials state
Metals. Metallurgy
Nondestructive testing
Review
History
Mechanical stress
X ray diffraction
Case history
Residual stress
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Summary:The principles and applications of the X-ray diffraction method of residual stress measurement are described, with particular regard to recent advances in theory and technology which have led to increased use of the method for the determination of both microstresses and macrostresses.
ISSN:0308-9126
DOI:10.1016/0308-9126(81)90076-6