Electron emission measurements from CVD diamond surfaces

Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emiss...

Full description

Saved in:
Bibliographic Details
Published inDiamond and related materials Vol. 5; no. 6; pp. 802 - 806
Main Authors Bozeman, S.P., Baumann, P.K., Ward, B.L., Powers, M.J., Cuomo, J.J., Nemanich, R.J., Dreifus, D.L.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.05.1996
Elsevier
Subjects
Adsorbed layers and thin films
Condensed matter: electronic structure, electrical, magnetic, and optical properties
CVD diamond
Electron and ion emission by liquids and solids; impact phenomena
Exact sciences and technology
Field emission
Field emission, ionization, evaporation, and desorption
Photoemission and photoelectron spectra
Physics
Secondary electron yield
UV photoelectron spectroscopy
UV photoelectron spectroscopy
Field emission
CVD diamond
Secondary electron yield
Fowler-Nordheim theory
Epitaxial layers
Hydrogen
Physical radiation effects
Diamonds
Surface treatments
Secondary emission
Experimental study
Photoelectron spectroscopy
Ultraviolet radiation
Electron beams
Electron emission
Online AccessGet full text

Cover

Abstract Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm −1. The film with the highest secondary yield also exhibits the lowest emission threshold.
AbstractList Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples exhibit a negative electron affinity after exposure to hydrogen plasma. Secondary electron emission yields vary from 2.2 to 9.2. Field emission current-voltage measurements indicate threshold voltages ranging from 28 to 84 V μm −1. The film with the highest secondary yield also exhibits the lowest emission threshold.
Author Ward, B.L.
Baumann, P.K.
Nemanich, R.J.
Dreifus, D.L.
Powers, M.J.
Bozeman, S.P.
Cuomo, J.J.
Author_xml – sequence: 1
  givenname: S.P.
  surname: Bozeman
  fullname: Bozeman, S.P.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 2
  givenname: P.K.
  surname: Baumann
  fullname: Baumann, P.K.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 3
  givenname: B.L.
  surname: Ward
  fullname: Ward, B.L.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 4
  givenname: M.J.
  surname: Powers
  fullname: Powers, M.J.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 5
  givenname: J.J.
  surname: Cuomo
  fullname: Cuomo, J.J.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 6
  givenname: R.J.
  surname: Nemanich
  fullname: Nemanich, R.J.
  organization: Department of Materials Science and Engineering and Department of Physics, North Carolina State University, Raleigh, NC 27695-7919, USA
– sequence: 7
  givenname: D.L.
  surname: Dreifus
  fullname: Dreifus, D.L.
  organization: Kobe Steel USA Inc, Electronic Materials Center, PO Box 13608, Research Triangle Park, NC 27709, USA
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3151399$$DView record in Pascal Francis
BookMark eNp9kE1LAzEQhoNUsK3-Aw978KCH1cwm2SQXQWr9gIIX9RrSZAKRbrYkq-C_d2ulR08zMM87wzMzMkl9QkLOgV4DhfaG6kbUumXiUosrSjnImh2RKSipa0rbZkKmB-SEzEr5oBQazWFK1HKDbsh9qrCLpcSx6dCWz4wdpqFUIfddtXi_r3y0XZ98NY6CdVhOyXGwm4Jnf3VO3h6Wr4unevXy-Ly4W9WOMTbUsHbWeu-1hIZ66YUKiBy8CkJ5xvlaeA2t8FJTL3QrA5cMwQklObQgFZsTvt_rcl9KxmC2OXY2fxugZmdvdmpmp2a0ML_2ho2xi31sa4uzm5BtcrEcsgwEMK1H7HaP4ajwFTGb4iImhz7m8S_G9_H_Oz_FRm7k
CitedBy_id crossref_primary_10_1007_s00339_005_3410_2
crossref_primary_10_1016_0925_9635_95_00485_8
crossref_primary_10_1016_j_susc_2006_01_087
crossref_primary_10_1016_S0925_9635_97_00181_7
crossref_primary_10_1016_S0040_6090_00_01432_2
crossref_primary_10_1088_1367_2630_4_1_379
crossref_primary_10_1103_PhysRevApplied_6_064031
crossref_primary_10_1116_1_1320809
crossref_primary_10_1021_am200867c
crossref_primary_10_1116_1_1577137
crossref_primary_10_1016_S0038_1101_00_00139_8
crossref_primary_10_1016_S0925_9635_01_00402_2
crossref_primary_10_1063_1_2717594
crossref_primary_10_1557_PROC_558_533
crossref_primary_10_1016_S0040_6090_99_00745_2
crossref_primary_10_1016_S0925_9635_98_00308_2
crossref_primary_10_1016_S0304_3991_02_00303_0
crossref_primary_10_1116_1_590857
crossref_primary_10_1016_S0925_9635_02_00042_0
crossref_primary_10_1063_1_126431
crossref_primary_10_1103_PhysRevB_59_15513
crossref_primary_10_1557_PROC_423_33
crossref_primary_10_1143_JJAP_38_791
crossref_primary_10_1016_S0925_9635_97_00256_2
crossref_primary_10_1088_0022_3727_43_13_135303
crossref_primary_10_1021_acsami_7b13821
crossref_primary_10_1016_S0925_9635_02_00186_3
crossref_primary_10_1021_am502330v
crossref_primary_10_1016_j_diamond_2008_10_017
crossref_primary_10_1016_S0925_9635_96_00660_7
crossref_primary_10_1021_jp0493475
crossref_primary_10_1134_1_1418509
crossref_primary_10_1088_0022_3727_40_8_S12
Cites_doi 10.1116/1.570596
10.1116/1.588347
10.1049/el:19931063
10.1103/PhysRevLett.74.777
10.1063/1.321593
10.1109/55.119164
10.1063/1.360066
10.1063/1.112611
10.1103/PhysRevB.50.5803
ContentType Journal Article
Conference Proceeding
Copyright 1996
1996 INIST-CNRS
Copyright_xml – notice: 1996
– notice: 1996 INIST-CNRS
DBID IQODW
AAYXX
CITATION
DOI 10.1016/0925-9635(95)00417-3
DatabaseName Pascal-Francis
CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Geology
Engineering
Chemistry
Physics
EISSN 1879-0062
EndPage 806
ExternalDocumentID 10_1016_0925_9635_95_00417_3
3151399
0925963595004173
GroupedDBID --K
--M
.~1
0R~
123
1B1
1~.
1~5
29G
4.4
457
4G.
5VS
7-5
71M
8P~
9JN
AABNK
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
ABFNM
ABFRF
ABJNI
ABMAC
ABXDB
ABXRA
ABYKQ
ACDAQ
ACGFO
ACGFS
ACIWK
ACNNM
ACRLP
ADBBV
ADEZE
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
ASPBG
AVWKF
AXJTR
AZFZN
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
GBLVA
HVGLF
HZ~
IHE
J1W
JJJVA
KOM
M24
M41
MAGPM
MO0
N9A
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
Q38
R2-
RIG
RNS
ROL
RPZ
SDF
SDG
SDP
SES
SEW
SMS
SPC
SPCBC
SPD
SSM
SST
SSZ
T5K
WUQ
XFK
XPP
ZMT
~02
~G-
AAPBV
ABPIF
ABPTK
IQODW
AAXKI
AAYXX
AFJKZ
AKRWK
CITATION
ID FETCH-LOGICAL-c333t-1bcaaddd97120d7d58fee41d8f58d344b5d9165d790d5967f473e1c5874161783
IEDL.DBID .~1
ISSN 0925-9635
IngestDate Thu Sep 26 19:18:26 EDT 2024
Sun Oct 22 16:05:17 EDT 2023
Fri Feb 23 02:25:00 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 6
Keywords UV photoelectron spectroscopy
Field emission
CVD diamond
Secondary electron yield
Fowler-Nordheim theory
Epitaxial layers
Hydrogen
Physical radiation effects
Diamonds
Surface treatments
Secondary emission
Experimental study
Photoelectron spectroscopy
Ultraviolet radiation
Electron beams
Electron emission
Language English
License CC BY 4.0
LinkModel DirectLink
MeetingName Diamond Films '95: European Conference on Diamond, Diamond-like and Related Materials
MergedId FETCHMERGED-LOGICAL-c333t-1bcaaddd97120d7d58fee41d8f58d344b5d9165d790d5967f473e1c5874161783
PageCount 5
ParticipantIDs crossref_primary_10_1016_0925_9635_95_00417_3
pascalfrancis_primary_3151399
elsevier_sciencedirect_doi_10_1016_0925_9635_95_00417_3
PublicationCentury 1900
PublicationDate 1996-05-01
PublicationDateYYYYMMDD 1996-05-01
PublicationDate_xml – month: 05
  year: 1996
  text: 1996-05-01
  day: 01
PublicationDecade 1990
PublicationPlace Amsterdam
PublicationPlace_xml – name: Amsterdam
PublicationTitle Diamond and related materials
PublicationYear 1996
Publisher Elsevier B.V
Elsevier
Publisher_xml – name: Elsevier B.V
– name: Elsevier
References Mearini, Krainsky, Dayton, Wang, Zorman, Angus, Huffman (BIB2) 1994; 65
Martinelli, Fisher (BIB9) 1974; 62
Modinos (BIB6) 1984
Huang, Cutler, Mishkovsky, Sullivan (BIB15) 1994; 13
Zhu, Kochanski, Jin, Siebles (BIB11) 1995; 78
Zangwill (BIB3) 1988
Pate, Spicer, Ohta, Lindau (BIB4) 1980; 17
Powers (BIB7) 1995
Bandis, Pate (BIB8) 1994; 74
Geis, Efremow, Woodhouse, McAleese, Marchywka, Socker, Hochedez (BIB1) 1991; 12
van der Weide, Zhang, Baumann, Wensell, Bernholc, Nemanich (BIB5) 1994; 50
Stratton (BIB16) 1955; 68
Seto (BIB10) 1975; 46
Latham (BIB14) 1981
Xu, Latham, Tzeng (BIB12) 1993; 29
Gomer (BIB13) 1961
Seto (10.1016/0925-9635(95)00417-3_BIB10) 1975; 46
Zangwill (10.1016/0925-9635(95)00417-3_BIB3) 1988
Huang (10.1016/0925-9635(95)00417-3_BIB15) 1994; 13
Powers (10.1016/0925-9635(95)00417-3_BIB7) 1995
Bandis (10.1016/0925-9635(95)00417-3_BIB8) 1994; 74
Latham (10.1016/0925-9635(95)00417-3_BIB14) 1981
Mearini (10.1016/0925-9635(95)00417-3_BIB2) 1994; 65
Zhu (10.1016/0925-9635(95)00417-3_BIB11) 1995; 78
Martinelli (10.1016/0925-9635(95)00417-3_BIB9) 1974; 62
Xu (10.1016/0925-9635(95)00417-3_BIB12) 1993; 29
Gomer (10.1016/0925-9635(95)00417-3_BIB13) 1961
Pate (10.1016/0925-9635(95)00417-3_BIB4) 1980; 17
van der Weide (10.1016/0925-9635(95)00417-3_BIB5) 1994; 50
Geis (10.1016/0925-9635(95)00417-3_BIB1) 1991; 12
Modinos (10.1016/0925-9635(95)00417-3_BIB6) 1984
Stratton (10.1016/0925-9635(95)00417-3_BIB16) 1955; 68
References_xml – volume: 46
  start-page: 5247
  year: 1975
  ident: BIB10
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Seto
– year: 1981
  ident: BIB14
  publication-title: High Voltage Vacuum Insulation: The Physical Basis
  contributor:
    fullname: Latham
– year: 1961
  ident: BIB13
  publication-title: Field Emission and Field Ionization
  contributor:
    fullname: Gomer
– year: 1995
  ident: BIB7
  article-title: Photoemission from BN and Secondary Electron Emission from Negative Electron Affinity Surfaces
  publication-title: M.S. Thesis
  contributor:
    fullname: Powers
– volume: 50
  start-page: 5803
  year: 1994
  ident: BIB5
  publication-title: Phys. Rev. B
  contributor:
    fullname: Nemanich
– volume: 78
  start-page: 2707
  year: 1995
  ident: BIB11
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Siebles
– volume: 12
  start-page: 456
  year: 1991
  ident: BIB1
  publication-title: IEEE Electron Device Lett.
  contributor:
    fullname: Hochedez
– volume: 68
  start-page: 746
  year: 1955
  ident: BIB16
  publication-title: Proc. Phys. Soc.
  contributor:
    fullname: Stratton
– volume: 13
  start-page: 526
  year: 1994
  ident: BIB15
  publication-title: J. Vac. Sci. Technol. B
  contributor:
    fullname: Sullivan
– volume: 17
  start-page: 1087
  year: 1980
  ident: BIB4
  publication-title: J. Vac. Sci. Technol.
  contributor:
    fullname: Lindau
– volume: 29
  start-page: 1596
  year: 1993
  ident: BIB12
  publication-title: Electron. Lett.
  contributor:
    fullname: Tzeng
– year: 1984
  ident: BIB6
  publication-title: Field, Thermionic, and Secondary Electron Emission Spectroscopy
  contributor:
    fullname: Modinos
– volume: 65
  start-page: 2702
  year: 1994
  ident: BIB2
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Huffman
– volume: 74
  start-page: 777
  year: 1994
  ident: BIB8
  publication-title: Phys. Rev. Lett.
  contributor:
    fullname: Pate
– volume: 62
  start-page: 1339
  year: 1974
  ident: BIB9
  publication-title: Proc. IEEE
  contributor:
    fullname: Fisher
– year: 1988
  ident: BIB3
  publication-title: Physics at Surfaces
  contributor:
    fullname: Zangwill
– volume: 17
  start-page: 1087
  year: 1980
  ident: 10.1016/0925-9635(95)00417-3_BIB4
  publication-title: J. Vac. Sci. Technol.
  doi: 10.1116/1.570596
  contributor:
    fullname: Pate
– year: 1981
  ident: 10.1016/0925-9635(95)00417-3_BIB14
  contributor:
    fullname: Latham
– volume: 13
  start-page: 526
  year: 1994
  ident: 10.1016/0925-9635(95)00417-3_BIB15
  publication-title: J. Vac. Sci. Technol. B
  doi: 10.1116/1.588347
  contributor:
    fullname: Huang
– volume: 29
  start-page: 1596
  year: 1993
  ident: 10.1016/0925-9635(95)00417-3_BIB12
  publication-title: Electron. Lett.
  doi: 10.1049/el:19931063
  contributor:
    fullname: Xu
– year: 1984
  ident: 10.1016/0925-9635(95)00417-3_BIB6
  contributor:
    fullname: Modinos
– volume: 74
  start-page: 777
  year: 1994
  ident: 10.1016/0925-9635(95)00417-3_BIB8
  publication-title: Phys. Rev. Lett.
  doi: 10.1103/PhysRevLett.74.777
  contributor:
    fullname: Bandis
– year: 1961
  ident: 10.1016/0925-9635(95)00417-3_BIB13
  contributor:
    fullname: Gomer
– volume: 46
  start-page: 5247
  year: 1975
  ident: 10.1016/0925-9635(95)00417-3_BIB10
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.321593
  contributor:
    fullname: Seto
– volume: 68
  start-page: 746
  year: 1955
  ident: 10.1016/0925-9635(95)00417-3_BIB16
  contributor:
    fullname: Stratton
– year: 1995
  ident: 10.1016/0925-9635(95)00417-3_BIB7
  article-title: Photoemission from BN and Secondary Electron Emission from Negative Electron Affinity Surfaces
  contributor:
    fullname: Powers
– volume: 62
  start-page: 1339
  year: 1974
  ident: 10.1016/0925-9635(95)00417-3_BIB9
  contributor:
    fullname: Martinelli
– volume: 12
  start-page: 456
  year: 1991
  ident: 10.1016/0925-9635(95)00417-3_BIB1
  publication-title: IEEE Electron Device Lett.
  doi: 10.1109/55.119164
  contributor:
    fullname: Geis
– year: 1988
  ident: 10.1016/0925-9635(95)00417-3_BIB3
  contributor:
    fullname: Zangwill
– volume: 78
  start-page: 2707
  year: 1995
  ident: 10.1016/0925-9635(95)00417-3_BIB11
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.360066
  contributor:
    fullname: Zhu
– volume: 65
  start-page: 2702
  year: 1994
  ident: 10.1016/0925-9635(95)00417-3_BIB2
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.112611
  contributor:
    fullname: Mearini
– volume: 50
  start-page: 5803
  year: 1994
  ident: 10.1016/0925-9635(95)00417-3_BIB5
  publication-title: Phys. Rev. B
  doi: 10.1103/PhysRevB.50.5803
  contributor:
    fullname: van der Weide
SSID ssj0012941
Score 1.6652519
Snippet Electron emission measurements on diamond films synthesized by chemical vapor deposition are reported. UV photoemission spectroscopy indicates that the samples...
SourceID crossref
pascalfrancis
elsevier
SourceType Aggregation Database
Index Database
Publisher
StartPage 802
SubjectTerms Adsorbed layers and thin films
Condensed matter: electronic structure, electrical, magnetic, and optical properties
CVD diamond
Electron and ion emission by liquids and solids; impact phenomena
Exact sciences and technology
Field emission
Field emission, ionization, evaporation, and desorption
Photoemission and photoelectron spectra
Physics
Secondary electron yield
UV photoelectron spectroscopy
Title Electron emission measurements from CVD diamond surfaces
URI https://dx.doi.org/10.1016/0925-9635(95)00417-3
Volume 5
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3PS8MwFH6IIioiOhWnbuTgQQ9xzZK0zXHMzelwB3G6W0iTBnZwDjcPXvzbTfpjbgcRPBXS1zR8fbx8Dd97D-BCJ1obagOsFNOY6cRiZS3BSSAsIWkQ6kzy_zAIe0N2P-KjpVwYL6ssYn8e07NoXYw0CjQb0_G4EQjH3EOfV-prRkW-4KevteVc-vprofJwu1nWvNIbY29dZs-RsLEYuxT8KpsD0992p92pmjnMbN7sYmkH6u7DXkEdUStf3QGspZMKbLXLjm0V2FkqLliBzdusae_nIcSdotcN8qb-eAy9_hwNzpBPMUHt5xvkfMV5pUHulvVSrSMYdjtP7R4uOiZgTSmdY5Jo5QKWERFpBiYyPLZpyoiJLY8NZSzhxtFBbiIRGAdeZFlEU6J5nP_nxPQY1idvk_QEkFWKEtVkMfPZs1qLQItQKEu1oCJkpAq4REpO88IYslSMeWSlR1YKLjNkJa1CVMIpVz6wdLH7jydrK-gvXkcdW3H86vTfM5_Bdi7C9vrFc1ifv3-kNccx5kk986I6bLTu-r2Bv_YfX_rfeV_M9A
link.rule.ids 310,311,315,783,787,792,793,4511,23944,23945,24130,25154,27938,27939,45599,45693
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV09T8MwED1BEQKEEBQQBQoZGGAwiWs7iUdUWgq0nVrUzXLsWOpAqWgZWPjt2Pko7YCQWJ2LE72c7i7Wu3sAVypRShMTICmpQlQlBkljMEoCbjBOg1BllP9eP-wM6dOIjZZ6YRytsoj9eUzPonWx4hdo-tPx2A-4rdxD11fqZkZFZB02qBufZX369mtB87DpLFOvdNbImZftczj0F2vXnN1kmyDyW3rancqZBc3kahdLKai9D3tF7ejd5a93AGvppApbzVKyrQo7S9MFq7D5kKn2fh5C3CrEbjxn6s7HvNefs8GZ53pMvObLvWedxbql9uwl47haRzBstwbNDiokE5AihMwRTpS0EUvzCDcCHWkWmzSlWMeGxZpQmjBt60GmIx5oi15kaERSrFic_-jE5Bgqk7dJegKekZJg2aAxde2zSvFA8ZBLQxQnPKS4BqhESkzzyRiipIw5ZIVDVnAmMmQFqUFUwilWvrCwwfuPO-sr6C8eR2y5Ygus03_vfAlbnUGvK7qP_ecz2M4Z2Y7MeA6V-ftHWrcFxzy5yDzqGySGzPM
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Diamond+and+related+materials&rft.atitle=Electron+emission+measurements+from+CVD+diamond+surfaces&rft.au=BOZEMAN%2C+S.+P&rft.au=BAUMANN%2C+P.+K&rft.au=WARD%2C+B.+L&rft.au=POWERS%2C+M.+J&rft.date=1996-05-01&rft.pub=Elsevier&rft.issn=0925-9635&rft.eissn=1879-0062&rft.volume=5&rft.issue=6-8&rft.spage=802&rft.epage=806&rft_id=info:doi/10.1016%2F0925-9635%2895%2900417-3&rft.externalDBID=n%2Fa&rft.externalDocID=3151399
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0925-9635&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0925-9635&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0925-9635&client=summon