Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background

• Published in: Chinese physics C Vol. 34; no. 12; pp. 1895 - 1899
• Main Author: 李树伟 康克军 王义 李金 李元景 张清军
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.12.2010; Department of Engineering Physics,Tsinghua University,Beijing 100084,China; Key Laboratory of Particle & Radiation ImagingTsinghua University,Ministry of Education,Beijing 100084,China%Nuctech Company Limited,Beijing 100084,China
• Subjects: X射线检测; 厚度测量; 探测器; 散射光子; 检测阈值; 测量实验; 测量系统; 背景环境; environmental scattering background; X-ray; Cerenkov detector; thickness measurement
• ISSN: 1674-1137; 0254-3052; 2058-6132
• DOI: 10.1088/1674-1137/34/12/020

The variation in environmental scattering background is a major source of systematic errors in X- ray inspection and measurement systems. As the energy of these photons consisting of environmental scattering background is much lower generally, the Cerenkov detectors having the detection threshold are likely insensitive to them and able to exclude their influence. A thickness measurement experiment is designed to verify the idea by employing a Cerenkov detector and an ionizing chamber for comparison. Furthermore, it is also found that the application of the Cerenkov detectors is helpful to exclude another systematic error from the variation of low energy components in the spectrum incident on the detector volume.