A dC/dV Measurement for Quantum-Dot Light-Emitting Diodes

• Published in: Chinese physics letters Vol. 39; no. 12; pp. 128401 - 102
• Main Authors: Ma, Jingrui, Tang, Haodong, Qu, Xiangwei, Xiang, Guohong, Jia, Siqi, Liu, Pai, Wang, Kai, Sun, Xiao Wei
• Format: Journal Article
• Language: English
• Published: Chinese Physical Society and IOP Publishing Ltd 01.12.2022; Institute of Nanoscience and Applications,Southern University of Science and Technology,Shenzhen 518055,China; Institute of Nanoscience and Applications,Southern University of Science and Technology,Shenzhen 518055,China%Key Laboratory of Energy Conversion and Storage Technologies(SUSTech)of Ministry of Education,Guangdong-Hong Kong-Macao Joint Laboratory for Photonic-Thermal-Electrical Energy Materials and Devices,SUSTech-Huawei Joint Lab for Photonics Industry,and Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen 518055,China; Key Laboratory of Energy Conversion and Storage Technologies(SUSTech)of Ministry of Education,Guangdong-Hong Kong-Macao Joint Laboratory for Photonic-Thermal-Electrical Energy Materials and Devices,SUSTech-Huawei Joint Lab for Photonics Industry,and Department of Electrical and Electronic Engineering,Southern University of Science and Technology,Shenzhen 518055,China; Shenzhen Planck Innovation Technologies Co.Ltd.,Shenzhen 518173,China

We present dC / dV analysis based on the capacitance-voltage ( C – V ) measurement of quantum-dot light-emitting diodes (QLEDs), and find that some key device operating parameters (electrical and optical turn-on voltage, peak capacitance, maximum efficiency) can be directly related to the turning po...