Development of radiation tolerant monolithic active pixel sensors with fast column parallel read-out

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 624; no. 2; pp. 437 - 442
• Main Authors: Koziel, M., Dorokhov, A., Fontaine, J.-C., De Masi, R., Winter, M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 11.12.2010
• Subjects: Active pixel sensors; CBM; Columns (structural); EUDET; Ionizing radiation; Monolithic active pixel sensors; Noise; Radiation hardness; Radiation tolerance; Semiconductor devices; STAR; Transistors; Radiation tolerance; STAR; Radiation hardness; Monolithic active pixel sensors; EUDET; CBM
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2010.02.084

Monolithic active pixel sensors (MAPS) [1] (Turchetta et al., 2001) are being developed at IPHC—Strasbourg to equip the EUDET telescope [2] (Haas, 2006) and vertex detectors for future high energy physics experiments, including the STAR upgrade at RHIC [3] (T.S. Collaboration, 2005) and the CBM experiment at FAIR/GSI [4] (Heuser, 2006). High granularity, low material budget and high read-out speed are systematically required for most applications, complemented, for some of them, with high radiation tolerance. A specific column-parallel architecture, implemented in the MIMOSA-22 sensor, was developed to achieve fast read-out MAPS. Previous studies of the front-end architecture integrated in this sensor, which includes in-pixel amplification, have shown that the fixed pattern noise increase consecutive to ionizing radiation can be controlled by means of a negative feedback [5] (Hu-Guo et al., 2008). However, an unexpected rise of the temporal noise was observed. A second version of this chip (MIMOSA-22bis) was produced in order to search for possible improvements of the radiation tolerance, regarding this type of noise. In this prototype, the feedback transistor was tuned in order to mitigate the sensitivity of the pixel to ionizing radiation. The performances of the pixels after irradiation were investigated for two types of feedback transistors: enclosed layout transistor (ELT) [6] (Snoeys et al., 2000) and “standard” transistor with either large or small transconductance. The noise performance of all test structures was studied in various conditions (expected in future experiments) regarding temperature, integration time and ionizing radiation dose. Test results are presented in this paper. Based on these observations, ideas for further improvement of the radiation tolerance of column parallel MAPS are derived.