Development of the program EOD for design in electron and ion microscopy
The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a sing...
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Published in | Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 645; no. 1; pp. 278 - 282 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
21.07.2011
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Subjects | |
Online Access | Get full text |
ISSN | 0168-9002 1872-9576 |
DOI | 10.1016/j.nima.2010.12.198 |
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Abstract | The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail. |
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AbstractList | The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail. |
Author | Zlámal, J. Lencová, B. |
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CitedBy_id | crossref_primary_10_1134_S1027451020060336 crossref_primary_10_3390_nano12010071 crossref_primary_10_1016_j_ultramic_2018_03_023 crossref_primary_10_1016_j_ultramic_2013_10_004 crossref_primary_10_1017_S1431927615013355 crossref_primary_10_1093_mam_ozae044_509 crossref_primary_10_1017_S143192761501315X crossref_primary_10_1016_j_ultramic_2011_11_009 crossref_primary_10_1134_S1027451019040074 crossref_primary_10_1166_jno_2022_3226 crossref_primary_10_3390_ma12142307 crossref_primary_10_1116_1_4826250 crossref_primary_10_1016_j_ultramic_2014_05_006 crossref_primary_10_1016_j_ultramic_2021_113268 crossref_primary_10_1093_mam_ozae072 crossref_primary_10_1021_acsanm_1c00204 crossref_primary_10_1016_j_nimb_2017_10_034 crossref_primary_10_1017_S1431927615013446 crossref_primary_10_1016_j_ultramic_2020_113157 |
Cites_doi | 10.1016/j.nima.2010.12.200 10.1016/j.ultramic.2009.07.001 10.1116/1.584329 10.1016/j.vacuum.2009.07.007 10.1016/j.phpro.2008.07.111 10.1116/1.584678 10.1016/S1387-3806(00)00305-5 10.1016/S0168-9002(98)01551-4 |
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SubjectTerms | Accelerators Chambers Computation Finite element method Ion microscopes Microscopy Misalignment Space charge Tolerancing User interface Workplaces |
Title | Development of the program EOD for design in electron and ion microscopy |
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