Development of the program EOD for design in electron and ion microscopy

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a sing...

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Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 645; no. 1; pp. 278 - 282
Main Authors Zlamal, J, Lencova, B
Format Journal Article
LanguageEnglish
Published Elsevier B.V 21.07.2011
Subjects
Accelerators
Chambers
Computation
Finite element method
Ion microscopes
Microscopy
Misalignment
Space charge
Tolerancing
User interface
Workplaces
Finite element method
User interface
Tolerancing
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ISSN0168-9002
1872-9576
DOI10.1016/j.nima.2010.12.198

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Summary:The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2010.12.198