Structural characterization of chemically deposited PbS thin films

• Published in: Materials science & engineering. B, Solid-state materials for advanced technology Vol. 136; no. 2; pp. 187 - 192
• Main Authors: Fernández-Lima, F.A., González-Alfaro, Y., Larramendi, E.M., Fonseca Filho, H.D., Maia da Costa, M.E.H., Freire, F.L., Prioli, R., de Avillez, R.R., da Silveira, E.F., Calzadilla, O., de Melo, O., Pedrero, E., Hernández, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.01.2007
• Subjects: Diffraction; Ion beam; Semiconductors; Sulfides; Surface morphology; Thin films; Thin films; Ion beam; Sulfides; Diffraction; Semiconductors; Surface morphology
• ISSN: 0921-5107; 1873-4944
• DOI: 10.1016/j.mseb.2006.09.029

Polycrystalline thin films of lead sulfide (PbS) grown using substrate colloidal coating chemical bath depositions were characterized by RBS, XPS, AFM and GIXRD techniques. The films were grown on glass substrates previously coated with PbS colloidal particles in a polyvinyl alcohol solution. The PbS films obtained with the inclusion of the polymer showed non-oxygen-containing organic contamination. All samples maintained the Pb:S 1:1 stoichiometry throughout the film. The amount of effective nucleation centers and the mean grain size have being controlled by the substrate colloidal coating. The analysis of the polycrystalline PbS films showed that a preferable (1 0 0) lattice plane orientation parallel to the substrate surface can be obtained using a substrate colloidal coating chemical bath deposition, and the orientation increases when a layer of colloid is initially dried on the substrate.