Morphological evolution of films composed of energetic and size-selected silver nanocluster ions

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 267; no. 8-9; pp. 1432 - 1435
• Main Authors: Bhattacharyya, S.R., Datta, D., Chini, T.K., Ghose, D., Shyjumon, I., Hippler, R.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.05.2009
• Subjects: Cluster flattening; Metal nanocluster; Morphology; Rapid thermal annealing (RTA); Scanning electron microscopy; Supported clusters; 79.20.Rf; Scanning electron microscopy; 36.40.Sx; Cluster flattening; Morphology; 36.40.−c; Supported clusters; 82.30.Nr; Rapid thermal annealing (RTA); Metal nanocluster; 36.40.Wa
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/j.nimb.2009.01.124

In this study, morphologies of as-deposited and rapid thermal annealed films of silver nanoclusters are studied using scanning electron microscope (SEM) and atomic force microscope (AFM). Size-selected silver nanoclusters, containing 5000 atoms in a cluster, produced by the gas condensation method are deposited on Si substrate for a period of 8min. In order to get an idea about the melting of clusters, the film is treated by rapid thermal annealing at 200 and 400°C. The remarkable changes of morphology due to annealing signify a lowering of melting temperature of silver in the form of nanoscale particles.