Structural analysis of CdS thin films obtained by multiple dips of oscillating chemical bath

• Published in: Materials science & engineering. B, Solid-state materials for advanced technology Vol. 165; no. 1; pp. 74 - 76
• Main Authors: Gutiérrez Lazos, C.D., Rosendo, E., Ortega, M., Oliva, A.I., Tapia, O., Díaz, T., Juárez, H., García, G., Rubín, M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 25.11.2009
• Subjects: Cadmium sulfide; Chemical bath deposition; X-ray diffraction; Chemical bath deposition; X-ray diffraction; Cadmium sulfide
• ISSN: 0921-5107; 1873-4944
• DOI: 10.1016/j.mseb.2009.03.003

Highly oriented CdS thin films with thicknesses greater than 1 μm were deposited by multiple dips, using oscillating chemical bath deposition (OCBD) at the bath temperature of 75 °C, and deposition time ranging from 15 to 75 min for a single dip. Samples with different thickness were prepared by repeating the deposition process for two and three times. The films deposited by a single dip have the α-greenockite structure showing the (0 0 2) as preferred orientation, as indicated by the X-ray diffraction measurements. This notable characteristic is preserved in the samples obtained from two or three dips. The crystallite size for the samples deposited by a single dip depends on the deposition time, because it varied from 23 to 37 nm as the deposition time increased. Nevertheless for samples deposited by two and three dips, the grain size shows no noticeable change, being about 22 nm.