Si nanocrystals formation by a new ion implantation device
Metallic and non-metallic ion beams can be used to modify the properties of wafer surfaces if accelerated at moderate energies. We developed a new “implantation machine” able to generate ions and to accelerate them up to 80kV. The ion generation is achieved by a laser-plasma source which creates pla...
Saved in:
Published in | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 266; no. 10; pp. 2486 - 2489 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.05.2008
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Metallic and non-metallic ion beams can be used to modify the properties of wafer surfaces if accelerated at moderate energies. We developed a new “implantation machine” able to generate ions and to accelerate them up to 80kV. The ion generation is achieved by a laser-plasma source which creates plasma in expansion. The device consists of a KrF excimer laser and a generating vacuum chamber made of stainless steel. The laser energy was 45mJ/pulse with a power density of 2.25×108W/cm2. The target was kept to positive voltage to accelerate the produced ions. The ion dose was estimated by a fast polarised Faraday cup. This machine was utilised to try synthesizing silicon nanocrystals in SiO2 matrix. Preliminary results of Si nanocrystals formation and the glancing-angle X-ray diffraction analyses are reported. |
---|---|
Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0168-583X 1872-9584 |
DOI: | 10.1016/j.nimb.2008.03.030 |