Spectral filtering of high-order harmonics via optics-free focusing

Controlling the wavefront of an extreme ultraviolet (XUV) high-order harmonic beam during the generation process offers the capability of modifying the beam properties without resorting to any XUV optics. By characterizing the XUV intensity profile and wavefront, we quantitatively retrieve both the...

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Bibliographic Details
Published inOptics express Vol. 29; no. 19; pp. 29813 - 29827
Main Authors Veyrinas, K., Vábek, J., Valentin, C., Descamps, D., Péjot, C., Burgy, F., Constant, E., Mével, E., Catoire, F.
Format Journal Article
LanguageEnglish
Published Optical Society of America - OSA Publishing 13.09.2021
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Summary:Controlling the wavefront of an extreme ultraviolet (XUV) high-order harmonic beam during the generation process offers the capability of modifying the beam properties without resorting to any XUV optics. By characterizing the XUV intensity profile and wavefront, we quantitatively retrieve both the size and the position of the waist of each harmonic generated in an argon jet. We show that optics-free focusing can occur under specific generating conditions leading to XUV focii of micrometer size. We also demonstrate that each focus is located at distinct longitudinal positions. Using this remarkable XUV wavefront control combined with near focus spatial selection, we experimentally demonstrate efficient and adjustable spectral filtering of the XUV beam, along with a strong rejection of the fundamental beam, without using any XUV optics. The experimental results are compared with simulations providing the impact of the filtering on the temporal profile of the XUV field. It shows that the attosecond structure is preserved and that the beam is more homogeneous after the filtering, thereby reducing the longitudinal focii shift. This is a major step to achieve high XUV intensity and probing ultrafast processes with an improved resolution.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.436086