A concept for automated nanoscale atomic force microscope (AFM) measurements using a priori knowledge

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Bibliographic Details
Published inMeasurement science & technology Vol. 20; no. 8; p. 084026
Main Authors Recknagel, C, Rothe, H
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.08.2009
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ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/20/8/084026