Optical differential reflectance spectroscopy of ultrathin epitaxial organic films

This Perspective does not have the ambition to entirely review the subject of optical spectroscopy on thin organic films. What we will try to achieve instead is to give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to s...

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Bibliographic Details
Published inPhysical chemistry chemical physics : PCCP Vol. 11; no. 13; pp. 2142 - 2155
Main Authors Forker, Roman, Fritz, Torsten
Format Journal Article
LanguageEnglish
Published Cambridge Royal Society of Chemistry 01.01.2009
Subjects
Chemistry
Exact sciences and technology
General and physical chemistry
Thickness
Substrate
Monolayer
Growth
Film
Optical properties
Review
Epitaxial film
Structure
Real time
Thin film
Reflectance
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Summary:This Perspective does not have the ambition to entirely review the subject of optical spectroscopy on thin organic films. What we will try to achieve instead is to give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to several monolayers, as a tool to study the absorption behavior of such films. By doing so, we will emphasize the relations between the physical layer structure and the resulting optical properties. More specifically, we intend to show on the basis of particular examples what physical effects can be favorably examined by means of real-time optical spectroscopy, i.e., applied during the actual film growth, especially differential reflectance spectroscopy (DRS). Epitaxial organic films on inorganic substrates (insulators and conductors) will be in focus, and also the perspectives of investigating organic-organic heteroepitaxial layers will be addressed.
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ISSN:1463-9076
1463-9084
DOI:10.1039/b814628d