Effects of the interface roughness in the optical response of one-dimensional photonic crystals of porous silicon

• Published in: Physica. B, Condensed matter Vol. 560; pp. 133 - 139
• Main Authors: Lujan-Cabrera, I.A., Ramirez-Gutierrez, C.F., Castaño-Yepes, J.D., Rodriguez-Garcia, M.E.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.05.2019; Elsevier BV
• Subjects: Admittance; Bragg reflectors; Crystal defects; Crystal structure; Interface roughness; Optical properties; Photonic crystals; Photonics; Porous materials; Porous media; Porous silicon; Quantum confinement; Reflectance; Scattering; Silicon; Simulation; Surface roughness; Transfer matrix; Quantum confinement; Transfer matrix; Admittance; Porous silicon; Scattering; Reflectance
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/j.physb.2019.02.010

Photonic structures such as distributed Bragg reflectors (DBR) frequently present fabrication defects like as rough interfaces. Also, other materials like porous media present these defects inherently. Therefore, this work describes the optical response of one-dimensional photonic crystals (PhC) with roughness contributions using the transfer matrix method (TMM). A statistical procedure was performed in order to introduce roughness in the simulation as a root mean square (RMS) of the irregularities of each interface. It was found that the location where the rough interface is placed has effects on different regions of the spectrum, considerably affecting DBR optical quality. Finally, porous silicon (PSi) DBR was designed and fabricated with the purpose of comparing its optical response with the simulations. •It is presented an optical model that describes rough interfaces contributions.•Roughness location affects different spectral regions of the optical response.•This optical formalism model the reflectance of porous silicon photonic crystal.