Voltage-current curves of high-temperature superconductor tapes measured at controlled current ramp rate compared with collective flux creep model

•Voltage-current curves of 2G HTS tapes are measured at controlled current ramping rate.•Results are compared with the power-law flux creep modeling.•Effects of edge damage, ferromagnetic substrate, and conducting stabilizer are discussed. The voltage-current V(I) curve of high-temperature supercond...

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Bibliographic Details
Published inPhysica. C, Superconductivity Vol. 553; pp. 21 - 25
Main Authors Song, Wen-Juan, Li, Shuo, Chen, Du-Xing, Fang, Jin
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.10.2018
Elsevier BV
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Summary:•Voltage-current curves of 2G HTS tapes are measured at controlled current ramping rate.•Results are compared with the power-law flux creep modeling.•Effects of edge damage, ferromagnetic substrate, and conducting stabilizer are discussed. The voltage-current V(I) curve of high-temperature superconductor tapes as a function of current ramp rate R modelled by the collective flux creep model, with a power-law dependence of local electric field on current density, shows an approximate low-I relation V∝IR and a high-V relation V∝In. In order to compare experimental V(I) curves with the flux creep model prediction, a setup is designed with I provided by a dc power supply driven by an arbitrary waveform function generator and V and I data acquired synchronously by two nano-voltmeters. Some experimental results are given with their features discussed.
ISSN:0921-4534
1873-2143
DOI:10.1016/j.physc.2018.08.001