Effect of Silicon Dioxide Surface on Bias Stress Effect for Organic Field-Effect Transistors

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 48; no. 4S; p. 4
Main Authors Suemori, Kouji, Taniguchi, Misuzu, Kamata, Toshihide
Format Journal Article
LanguageEnglish
Published 01.04.2009
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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.48.04C170