Electronic relaxation of deep bulk trap and interface state in ZnO ceramics

Saved in:
Bibliographic Details
Published inChinese physics B Vol. 20; no. 2; p. 025201
Main Authors Yang, Yan (雁杨), Li, Sheng-Tao (盛涛 李), Ding, Can (璨丁), Cheng, Peng-Fei (鹏飞 成)
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.02.2011
Online AccessGet full text
ISSN1674-1056
2058-3834
DOI10.1088/1674-1056/20/2/025201

Cover

More Information
ISSN:1674-1056
2058-3834
DOI:10.1088/1674-1056/20/2/025201