Surface and optical characterization of yttrium hydride films deposited on regular glass to be used as switchable mirrors
Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hyd...
Saved in:
Published in | Surface and interface analysis Vol. 34; no. 1; pp. 311 - 315 |
---|---|
Main Authors | , , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Chichester, UK
John Wiley & Sons, Ltd
01.08.2002
Wiley |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10−7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd. |
---|---|
AbstractList | Abstract
Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10
−7
Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd. Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10−7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd. |
Author | Mateos, F. Castañer, R. Velásquez, P. Sánchez-López, M. M. Mallavia, R. Moreno, I. de la Casa-Lillo, M. A. Gutiérrez, A. |
Author_xml | – sequence: 1 givenname: P. surname: Velásquez fullname: Velásquez, P. email: pavelasquez@umh.es organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 2 givenname: R. surname: Castañer fullname: Castañer, R. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 3 givenname: M. A. surname: de la Casa-Lillo fullname: de la Casa-Lillo, M. A. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 4 givenname: M. M. surname: Sánchez-López fullname: Sánchez-López, M. M. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 5 givenname: R. surname: Mallavia fullname: Mallavia, R. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 6 givenname: I. surname: Moreno fullname: Moreno, I. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 7 givenname: A. surname: Gutiérrez fullname: Gutiérrez, A. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain – sequence: 8 givenname: F. surname: Mateos fullname: Mateos, F. organization: Universidad Miguel Hernández, Departamento de Ciencia y Tecnología de Materiales, Av. del Ferrocarril s/n, E-03202 Elche (Alicante), Spain |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=13887680$$DView record in Pascal Francis |
BookMark | eNp1kEFLHDEUgENR6KqF_oRcCr2MJpOdSeYoUrfCosgq7S28ybysaWdnlrwsdvz1RnapJw_hHfK9D953wo6GcUDGvkpxLoUoLyjAuVRCf2IzKZq6aBppjthMyHlZlPNSfmYnRH-EEEaZesam1S56cMhh6Pi4TcFBz90TRHAJY3iBFMaBj55PKcWw2_CnqYuhQ-5DvyHe4XakkDDvDjzietdD5OseiHgaeYt8R_kPiNNzSFnb9sg3IcYx0hk79tATfjnMU_Z4_ePh6mexvFvcXF0uC6eU1IWXGhrlTV1V8xZ8V6EGLBulFDjpaiVaXYPSXa2F0JjvUh4650xlFKo2v1P2fe91cSSK6O02hg3EyUph35LZnMy-Jcvotz26BcodfITBBXrnlTG6NiJzxZ57Dj1OH_rs6uby4D3wgRL--89D_GtrrXRlf90u7HLR6Gspftt79Qo6c40t |
CODEN | SIANDQ |
CitedBy_id | crossref_primary_10_1063_1_1896440 |
Cites_doi | 10.1149/1.1392040 10.1063/1.124853 10.1088/0022-3719/17/2/021 10.1038/380231a0 10.1103/PhysRevB.62.10088 10.1016/S0925-8388(96)02891-5 10.1051/epn:2001201 10.1038/29250 10.1002/sia.740060405 10.1103/PhysRevB.57.4943 10.1016/0925-8388(96)02286-4 10.1103/PhysRevLett.83.4614 10.1088/0022-3719/13/11/008 10.1002/sia.740150304 |
ContentType | Journal Article Conference Proceeding |
Copyright | Copyright © 2002 John Wiley & Sons, Ltd. 2002 INIST-CNRS |
Copyright_xml | – notice: Copyright © 2002 John Wiley & Sons, Ltd. – notice: 2002 INIST-CNRS |
DBID | BSCLL IQODW AAYXX CITATION |
DOI | 10.1002/sia.1307 |
DatabaseName | Istex Pascal-Francis CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | CrossRef |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Chemistry Physics |
EISSN | 1096-9918 |
EndPage | 315 |
ExternalDocumentID | 10_1002_sia_1307 13887680 SIA1307 ark_67375_WNG_LG97F10X_Q |
Genre | article |
GrantInformation_xml | – fundername: EU funderid: FEDER 1FD1997‐1508‐CO2‐01. |
GroupedDBID | -~X .3N .GA .Y3 05W 0R~ 10A 123 1L6 1OB 1OC 1ZS 31~ 33P 3SF 3WU 4.4 4ZD 50Y 50Z 51W 51X 52M 52N 52O 52P 52S 52T 52U 52W 52X 5VS 66C 702 7PT 8-0 8-1 8-3 8-4 8-5 8UM 930 A03 AAESR AAEVG AAHHS AANLZ AAONW AASGY AAXRX AAZKR ABCQN ABCUV ABEFU ABEML ABIJN ABJNI ABPVW ACAHQ ACBWZ ACCFJ ACCZN ACGFS ACIWK ACNCT ACPOU ACSCC ACXBN ACXQS ADBBV ADEOM ADIZJ ADKYN ADMGS ADOZA ADXAS ADZMN AEEZP AEIGN AEIMD AENEX AEQDE AEUQT AEUYR AFBPY AFFPM AFGKR AFPWT AFZJQ AHBTC AITYG AIURR AIWBW AJBDE AJXKR ALAGY ALMA_UNASSIGNED_HOLDINGS ALUQN AMBMR AMYDB ASPBG ATUGU AUFTA AVWKF AZBYB AZFZN AZVAB BAFTC BDRZF BFHJK BHBCM BMNLL BMXJE BNHUX BROTX BRXPI BSCLL BY8 CS3 D-E D-F DCZOG DPXWK DR1 DR2 DRFUL DRSTM DU5 EBS EJD F00 F01 F04 F5P FEDTE FOJGT G-S G.N GNP GODZA H.T H.X HBH HF~ HGLYW HHY HHZ HVGLF HZ~ I-F IX1 J0M JPC KQQ LATKE LAW LC2 LC3 LEEKS LH4 LITHE LOXES LP6 LP7 LUTES LW6 LYRES M6K MEWTI MK4 MRFUL MRSTM MSFUL MSSTM MXFUL MXSTM N04 N05 N9A NDZJH NF~ NNB O66 O9- P2P P2W P2X P4D PALCI Q.N Q11 QB0 QRW R.K RIWAO RJQFR RNS ROL RWI RWM RX1 RYL SAMSI SUPJJ TN5 UB1 V2E W8V W99 WBKPD WFSAM WH7 WIB WIH WIK WJL WOHZO WQJ WRC WTY WXSBR WYISQ XG1 XPP XV2 ZZTAW ~02 ~IA ~WT AAPBV ABHUG ACXME ADAWD ADDAD AFVGU AGJLS IQODW AAYXX CITATION |
ID | FETCH-LOGICAL-c3317-f17a93f86554bafd5e7ae29333ac1c630b76a37d67007e0003fadcc8583e3b3e3 |
IEDL.DBID | DR2 |
ISSN | 0142-2421 |
IngestDate | Fri Aug 23 01:52:12 EDT 2024 Sun Oct 22 16:04:18 EDT 2023 Sat Aug 24 01:02:22 EDT 2024 Wed Oct 30 09:52:52 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Keywords | Scanning electron microscopy Inorganic compounds Transition element compounds Optical windows Palladium X-ray spectra Surface analysis Dispersive spectrometry Transmittance Thin films Transition elements Yttrium hydrides Ultraviolet visible spectrum Depth profiles Vacuum deposition X-ray photoelectron spectra Semiconductor metal transition |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | ECASIA'01: proceedings of the 9th European conference on applications of surface and interface analysis, 30th September-5th October 2001, Avignon, France |
MergedId | FETCHMERGED-LOGICAL-c3317-f17a93f86554bafd5e7ae29333ac1c630b76a37d67007e0003fadcc8583e3b3e3 |
Notes | EU - No. FEDER 1FD1997-1508-CO2-01. istex:F97DC0A9A944198A706FE453A6BDCD78DA3F70C6 ark:/67375/WNG-LG97F10X-Q ArticleID:SIA1307 |
PageCount | 5 |
ParticipantIDs | crossref_primary_10_1002_sia_1307 pascalfrancis_primary_13887680 wiley_primary_10_1002_sia_1307_SIA1307 istex_primary_ark_67375_WNG_LG97F10X_Q |
PublicationCentury | 2000 |
PublicationDate | August 2002 |
PublicationDateYYYYMMDD | 2002-08-01 |
PublicationDate_xml | – month: 08 year: 2002 text: August 2002 |
PublicationDecade | 2000 |
PublicationPlace | Chichester, UK |
PublicationPlace_xml | – name: Chichester, UK – name: Chichester |
PublicationTitle | Surface and interface analysis |
PublicationTitleAlternate | Surf. Interface Anal |
PublicationYear | 2002 |
Publisher | John Wiley & Sons, Ltd Wiley |
Publisher_xml | – name: John Wiley & Sons, Ltd – name: Wiley |
References | Huiberts JN, Griessen R, Rector JH, Wijngaarden RJ, Dekker JP, de Groot DG, Koeman NJ. Nature 1996; 380: 231. Fujimori A, Schlapbach L. J. Phys. C 1984; 17: 341. Baba Y, Sasaki TA. Surf. Interface Anal. 1984; 6: 171. Kremers M, Koeman NJ, Griessen R, Notten PHL, Tolboom R, Kelly PJ, Duine PA. Phys. Rev. B. 1998; 57: 4943. Kooij ES, van Gogh ATM, Griessen R. J. Electrochem. Soc. 1999; 148: 2990. Griessen R. Europhys. News 2001; March/April: 41. Armitage R, Rubin M, Richarson T, O'Brien N, Chen Y. Appl. Phys. Lett. 1999; 75: 1863. Kooij ES, van Gogh ATM, Nagengast DG, Koeman NJ, Grissen R. Phys. Rev. B 2000; 62: 10 088. Joannopoulos JD, Meade RD, Winn JN. Optical Processing of Information. Princeton University Press: Princeton, NJ, 1996. Huiberts JN, Rector JH, Wijngaarden RJ, Jetten S, de Groot D, Dam B, Koeman NJ, Griessen R, Hjörvarsson B, Olafsson S, Cho YS. J. Alloy. Comp. 1996; 239: 158. Griessen R, Huiberts JN, Kremers M, van Gogh ATM, Koeman NJ, Dekker JP, Notten PHL. J. Alloy. Comp. 1997; 253/254: 44. Nyholm R, Matersson N. J. Phys. C 1980; 13: 279. den Broeder FJA, van der Molen SJ, Kremers M, Huiberts JN, Nagengast DG, van Gogh ATM, Huisman WH, Koemaan NJ, Dam B, Rector JH, Plota S, Haaksma M, Hanzer RMN, Jungblut RM, Duine PA, Griessen R. Nature 1998; 394: 656. Reichl R, Gaukler KH. Surf. Interface Anal. 1990; 15: 211. van Gogh ATM, Kooij ES, Griessen R. Phys. Rev. Lett. 1999; 83: 4614. 2001 1990; 15 1997; 253/254 1983; 1 1984; 17 1980; 13 1984; 6 2000; 62 1996; 380 1996 1999; 75 1999; 83 1999; 148 1996; 239 1998; 394 1998; 57 e_1_2_1_6_2 e_1_2_1_7_2 e_1_2_1_5_2 e_1_2_1_2_2 e_1_2_1_11_2 e_1_2_1_3_2 Joannopoulos JD (e_1_2_1_4_2) 1996 e_1_2_1_12_2 e_1_2_1_10_2 e_1_2_1_15_2 e_1_2_1_16_2 e_1_2_1_13_2 e_1_2_1_14_2 e_1_2_1_8_2 e_1_2_1_17_2 e_1_2_1_9_2 |
References_xml | – start-page: 41 year: 2001 publication-title: Europhys. News – volume: 253/254 start-page: 44 year: 1997 publication-title: J. Alloy. Comp. – volume: 15 start-page: 211 year: 1990 publication-title: Surf. Interface Anal. – volume: 148 start-page: 2990 year: 1999 publication-title: J. Electrochem. Soc. – volume: 239 start-page: 158 year: 1996 publication-title: J. Alloy. Comp. – volume: 6 start-page: 171 year: 1984 publication-title: Surf. Interface Anal. – volume: 380 start-page: 231 year: 1996 publication-title: Nature – volume: 17 start-page: 341 year: 1984 publication-title: J. Phys. C – volume: 57 start-page: 4943 year: 1998 publication-title: Phys. Rev. B. – volume: 394 start-page: 656 year: 1998 publication-title: Nature – year: 1996 – volume: 62 start-page: 10 088 year: 2000 publication-title: Phys. Rev. B – volume: 1 year: 1983 – volume: 13 start-page: 279 year: 1980 publication-title: J. Phys. C – volume: 83 start-page: 4614 year: 1999 publication-title: Phys. Rev. Lett. – volume: 75 start-page: 1863 year: 1999 publication-title: Appl. Phys. Lett. – ident: e_1_2_1_16_2 doi: 10.1149/1.1392040 – volume-title: Optical Processing of Information year: 1996 ident: e_1_2_1_4_2 contributor: fullname: Joannopoulos JD – ident: e_1_2_1_17_2 doi: 10.1063/1.124853 – ident: e_1_2_1_13_2 doi: 10.1088/0022-3719/17/2/021 – ident: e_1_2_1_2_2 doi: 10.1038/380231a0 – ident: e_1_2_1_9_2 doi: 10.1103/PhysRevB.62.10088 – ident: e_1_2_1_3_2 doi: 10.1016/S0925-8388(96)02891-5 – ident: e_1_2_1_10_2 doi: 10.1051/epn:2001201 – ident: e_1_2_1_5_2 doi: 10.1038/29250 – ident: e_1_2_1_14_2 doi: 10.1002/sia.740060405 – ident: e_1_2_1_7_2 doi: 10.1103/PhysRevB.57.4943 – ident: e_1_2_1_6_2 doi: 10.1016/0925-8388(96)02286-4 – ident: e_1_2_1_12_2 – ident: e_1_2_1_8_2 doi: 10.1103/PhysRevLett.83.4614 – ident: e_1_2_1_15_2 doi: 10.1088/0022-3719/13/11/008 – ident: e_1_2_1_11_2 doi: 10.1002/sia.740150304 |
SSID | ssj0008386 |
Score | 1.6627091 |
Snippet | Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and... Abstract Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy... |
SourceID | crossref pascalfrancis wiley istex |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 311 |
SubjectTerms | Chemical composition analysis, chemical depth and dopant profiling Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science; rheology Exact sciences and technology Materials science Materials testing metal hydrides Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity) Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of bulk materials and thin films palladium Physics switchable mirrors thin films yttrium |
Title | Surface and optical characterization of yttrium hydride films deposited on regular glass to be used as switchable mirrors |
URI | https://api.istex.fr/ark:/67375/WNG-LG97F10X-Q/fulltext.pdf https://onlinelibrary.wiley.com/doi/abs/10.1002%2Fsia.1307 |
Volume | 34 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1dT9RAFJ0QCNEXFNS4qGRMiG-FttN22keCLkiEBJC4iQ_NdD60wW1Jpw0sv957p9vdrImJ8aHpQ2em7XzdMzPnnkvIPhglkaVJ7GVKZl4kg8gDlCC9ONVhBBZX-TE6J59fJKc30dkknsxZlegL0-tDLDbccGS4-RoHuCjs4VI01JYCQxmjI3nAOLK5Pl4tlaNS5oI8wgIgdKeeg-6sHx4OGVcs0QZW6gMyI4WFyjF9VItVxOpMzvgZ-T58bM80uT3o2uJAPv6h4_h_f_OcbM2RKD3qu842WdPVDnlyPASA2yGbjh0q7Qsyu-4aI6SmolK0vnPb31QupJ57T05aGzpr26bspvTnDKO2a2rKX1NLlXbUMA15K9roH8h8pQ6207amhaadhWfCUntfQidCZy46LZumbuxLcjP-9PX41JvHbPAkAyjimYCLjBl0d40KYVSsudAAKRgTMpAJ8wueCMYVegdxjSsyI5SUaZwyzQq4XpH1qq70a0IBnASFZIlSfhrpSGRBZACAglEPmWQBG5H3Q_vld700R96LMIc5VCce1PER-eAadpFANLdIZeNx_u3iJP9ykvFx4E_yyxHZW2n5ZYkMpuEk9aEk135_fVV-_fkI77v_mvANeepCyzg24Vuy3jadfgcIpy32XF_-DWP--B8 |
link.rule.ids | 310,311,315,783,787,792,793,1378,23942,23943,25152,27936,27937,46306,46730 |
linkProvider | Wiley-Blackwell |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bT9RAFD5BiMEXVJS4oDgmxrdC22k7bXwi4LLosokCcR9MmulctIFtSS_R9ddzZkp3syYmxoemD52ZtnM738yc830Ab9Eo8SSOQieRInEC4QUOogThhLHyA7S40g1NcPL5JBpdBR-n4XQN3vexMB0_xGLDzYwMO1-bAW42pA-XrKF1zo2WMXsAGzjaqdFtOPmy5I6KqZV5xCWAb889e-ZZ1z_sc67Yog1Trb-MbySvsXp0p2uxilmt0Rk-hm_953a-JtcHbZMdiN9_MDn-5_88ga17MEqOut7zFNZUsQ2bx70G3DY8tA6ion4G84u20lwowgtJylu7A07Egu25C-YkpSbzpqnydkZ-zI1wuyI6v5nVRCrrHaYwb0Eq9d04vxKL3ElTkkyRtsZnvCb1zxz7kYnnIrO8qsqqfg5Xww-XxyPnXrbBERTRiKM9xhOqTcRrkHEtQ8W4QlRBKReeiKibsYhTJk2AEFNmUaa5FCIOY6pohtcOrBdloV4AQXziZYJGUrpxoAKeeIFGDIp23aeCenQAb_oGTG87do6042H2U6xOc1bHBvDOtuwiAa-ujTcbC9Ovk9N0fJqwoedO088D2F9p-mWJFGfiKHaxJNuAf31VenF2ZO67_5rwNWyOLs_H6fhs8mkPHlmlGetc-BLWm6pVrxDwNNm-7dh3z2f8Nw |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Jb9QwFH6CViwXlgJiWIqRELe0SezEybEqTFsoI6BUjMQhcry0UZlklEUw_HqencmMBgkJcYhyiJ3Fz877bH_vewCv0CmJNIkjL1Uy9ZgMmIcoQXpRokOGHlf5kQ1O_jCJj8_Zu2k0XbIqbSxMrw-xWnCzI8P9r-0AnyuzvxYNbQphUxnz67DNYgS-FhB9XktHJdRlecQZQOi2PQfhWT_cH2puuKJt26o_LTVSNNg6pk9rsQlZnc8Z34Vvw9v2VJOrva7N9-SvP4Qc_-9z7sGdJRQlB33fuQ_XdLkDtw6HDHA7cMPRQ2XzABZnXW2E1ESUilRzt_5N5ErruQ_lJJUhi7ati25GLhc2bbsmpvg-a4jSjhumsW5Jan1hqa_E4XbSViTXpGvwmmhI86PAXmSjucisqOuqbh7C-fjtl8Njb5m0wZMUsYhnAi5Samy8K8uFUZHmQiOmoFTIQKKhch4LypUND-LaTsmMUFImUUI1zfF4BFtlVerHQBCdBLmksVJ-wjQTacAMIlD06iGVNKAjeDnYL5v32hxZr8IcZticdqeOj-C1M-yqgKivLJeNR9nXyVF2epTyceBPs08j2N2w_PqOFP_DceLjnZz9_vqo7OzkwJ6f_GvBF3Dz45txdnoyef8Ubrs0M45Z-Ay22rrTzxHttPmu69a_Aei--uY |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Surface+and+interface+analysis&rft.atitle=Surface+and+optical+characterization+of+yttrium+hydride+films+deposited+on+regular+glass+to+be+used+as+switchable+mirrors&rft.au=VELASQUEZ%2C+P&rft.au=CASTANER%2C+R&rft.au=DE+LA+CASA-LILLO%2C+M.+A&rft.au=SANCHEZ-LOPEZ%2C+M.+M&rft.date=2002-08-01&rft.pub=Wiley&rft.issn=0142-2421&rft.eissn=1096-9918&rft.volume=34&rft.issue=1&rft.spage=311&rft.epage=315&rft_id=info:doi/10.1002%2Fsia.1307&rft.externalDBID=n%2Fa&rft.externalDocID=13887680 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0142-2421&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0142-2421&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0142-2421&client=summon |