Surface and optical characterization of yttrium hydride films deposited on regular glass to be used as switchable mirrors

Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hyd...

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Published inSurface and interface analysis Vol. 34; no. 1; pp. 311 - 315
Main Authors Velásquez, P., Castañer, R., de la Casa-Lillo, M. A., Sánchez-López, M. M., Mallavia, R., Moreno, I., Gutiérrez, A., Mateos, F.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.08.2002
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Abstract Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10−7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd.
AbstractList Abstract Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10 −7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd.
Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10−7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd.
Author Mateos, F.
Castañer, R.
Velásquez, P.
Sánchez-López, M. M.
Mallavia, R.
Moreno, I.
de la Casa-Lillo, M. A.
Gutiérrez, A.
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Issue 1
Keywords Scanning electron microscopy
Inorganic compounds
Transition element compounds
Optical windows
Palladium
X-ray spectra
Surface analysis
Dispersive spectrometry
Transmittance
Thin films
Transition elements
Yttrium hydrides
Ultraviolet visible spectrum
Depth profiles
Vacuum deposition
X-ray photoelectron spectra
Semiconductor metal transition
Language English
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Snippet Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and...
Abstract Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy...
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SubjectTerms Chemical composition analysis, chemical depth and dopant profiling
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Materials testing
metal hydrides
Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
palladium
Physics
switchable mirrors
thin films
yttrium
Title Surface and optical characterization of yttrium hydride films deposited on regular glass to be used as switchable mirrors
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