Surface and optical characterization of yttrium hydride films deposited on regular glass to be used as switchable mirrors

Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hyd...

Full description

Saved in:
Bibliographic Details
Published inSurface and interface analysis Vol. 34; no. 1; pp. 311 - 315
Main Authors Velásquez, P., Castañer, R., de la Casa-Lillo, M. A., Sánchez-López, M. M., Mallavia, R., Moreno, I., Gutiérrez, A., Mateos, F.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.08.2002
Wiley
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Yttrium and palladium thin films deposited on glass have been characterized by means of XPS depth profiling, SEM, energy‐dispersive x‐ray spectroscopy and ultraviolet–visible spectroscopy. These films allow optical windows of variable transparency to be obtained based on the formation of yttrium hydride by hydrogenation, with the palladium film working as a barrier against yttrium oxidation but being permeable to hydrogen. The transformation of yttrium into its hydride is concomitant with a metal–semiconducting transition that changes the physical properties of the material, especially its optical behaviour: the transmittance in the visible range goes from 0% for the metallic state to 30–70% for the hydrogenated state. In this work, the preparation conditions of optical windows using low‐cost regular glass as substrate have been optimized, both regarding the deposition and the hydrogenation. Uniform films free of impurities, such as oxygen and carbon, have been obtained under ultrahigh vacuum conditions of ∼10−7 Pa. Deposition has been performed by electron bombardment of the material, using palladium and yttrium of high purity. Copyright © 2002 John Wiley & Sons, Ltd.
Bibliography:EU - No. FEDER 1FD1997-1508-CO2-01.
istex:F97DC0A9A944198A706FE453A6BDCD78DA3F70C6
ark:/67375/WNG-LG97F10X-Q
ArticleID:SIA1307
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.1307