Mid-wave T2SLs InAs/GaSb single pixel PIN detector with GaAs immersion lens for HOT condition
•We presented the mid-wave single (λ50%cut-off=5.2μm) pixel mesa PIN T2SLs InAs/GaSb detector with ∼1.1mm GaAs substrate converted into immersion lens to increase detectivity by ∼10.•At T=230K reached by thermoelectrical cooling, presented detector exhibits detectivity, D*∼2×1010cmHz1/2/W, under rev...
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Published in | Solid-state electronics Vol. 119; pp. 1 - 4 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.05.2016
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Subjects | |
Online Access | Get full text |
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Summary: | •We presented the mid-wave single (λ50%cut-off=5.2μm) pixel mesa PIN T2SLs InAs/GaSb detector with ∼1.1mm GaAs substrate converted into immersion lens to increase detectivity by ∼10.•At T=230K reached by thermoelectrical cooling, presented detector exhibits detectivity, D*∼2×1010cmHz1/2/W, under reverse bias 200mV.•At T=300K presented detector exhibits detectivity, D∗∼4×109cmHz1/2/W at 300K, under 500mV.•Presented results are higher than PIN architectures with the same and lower cut-off wavelength grown on GaAs without immersion lens and grown on GaSb substrates.•Detectivity for MWIR (λ50%cut-off=5.1μm) multi-layer MCT Auger suppressed, unbiased heterostructure with comparable λ50%cut-off=5.2μm, GaAs immersion lens is one order of magnitude higher than PIN T2SLs InAs/GaSb due to SRH defects.
In this paper we report on high operating temperature mid-wave infrared detector based on type-II superlattice InAs/GaSb mesa PIN architecture with 50% cut-off wavelength ∼5.2μm at 230K. The 1.1mm thick GaAs substrate was converted into immersion lens to limit an influence of the defects occurring during growth on GaAs substrate and to increase detectivity, ∼2×1010cmHz1/2/W at 230K, under reverse bias 100mV and ∼4×109cmHz1/2/W at 300K, under 500mV. Presented results are better than PIN architectures with the same and lower cut-off wavelength grown on GaAs without immersion lens and grown on GaSb substrates. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0038-1101 1879-2405 |
DOI: | 10.1016/j.sse.2016.01.012 |