Chopper z-scan technique for elliptic Gaussian beams

This paper reports an improvement to the chopper z-scan technique for elliptic Gaussian beams. This improvement results in a higher sensitivity by measuring the ratio of eclipsing time to rotating period (duty cycle) of a chopper that eclipses the beam along the main axis. It is shown that the z-sca...

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Bibliographic Details
Published inOptics express Vol. 24; no. 18; pp. 21105 - 21112
Main Authors Dávila-Pintle, J A, Reynoso-Lara, E, Bravo-García, Y E
Format Journal Article
LanguageEnglish
Published United States 05.09.2016
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Summary:This paper reports an improvement to the chopper z-scan technique for elliptic Gaussian beams. This improvement results in a higher sensitivity by measuring the ratio of eclipsing time to rotating period (duty cycle) of a chopper that eclipses the beam along the main axis. It is shown that the z-scan curve of the major axis is compressed along the z-axis. This compression factor is equal to the ratio between the minor and major axes. It was found that the normalized peak-valley difference with respect to the linear value does not depend on the axis along which eclipsing occurs.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.021105