Reliability of composite solder bumps produced by an in-situ process

In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu sub(6)Sn sub(5) dispersoids was investigated for its thermal stability. The stability was evaluated mainly by measuring the growth rate of intermetallics at in-situ composite solder/BLM in...

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Published inJournal of electronic materials Vol. 29; no. 10; pp. 1264 - 1269
Main Authors LEE, Jong-Hyun, DAEJIN PARK, MOON, Jong-Tae, LEE, Yong-Ho, DONG HYUK SHIN, KIM, Yong-Seog
Format Conference Proceeding Journal Article
LanguageEnglish
Published New York, NY Institute of Electrical and Electronics Engineers 01.10.2000
Springer Nature B.V
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Summary:In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu sub(6)Sn sub(5) dispersoids was investigated for its thermal stability. The stability was evaluated mainly by measuring the growth rate of intermetallics at in-situ composite solder/BLM interface as a function of the number of reflow soldering cycles and aging time. The rates were compared with those of the eutectic Pb-Sn and Sn-Ag solders. After the thermal treatments, the solder joints were tested for their shear strengths. The results indicated that the in-situ composite solder has a higher shear strength and better thermal stability than the eutectic Pb-Sn solder.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-000-0022-7