Reliability of composite solder bumps produced by an in-situ process
In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu sub(6)Sn sub(5) dispersoids was investigated for its thermal stability. The stability was evaluated mainly by measuring the growth rate of intermetallics at in-situ composite solder/BLM in...
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Published in | Journal of electronic materials Vol. 29; no. 10; pp. 1264 - 1269 |
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Main Authors | , , , , , |
Format | Conference Proceeding Journal Article |
Language | English |
Published |
New York, NY
Institute of Electrical and Electronics Engineers
01.10.2000
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Cu sub(6)Sn sub(5) dispersoids was investigated for its thermal stability. The stability was evaluated mainly by measuring the growth rate of intermetallics at in-situ composite solder/BLM interface as a function of the number of reflow soldering cycles and aging time. The rates were compared with those of the eutectic Pb-Sn and Sn-Ag solders. After the thermal treatments, the solder joints were tested for their shear strengths. The results indicated that the in-situ composite solder has a higher shear strength and better thermal stability than the eutectic Pb-Sn solder. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-000-0022-7 |