NIR spectrometer using a Schottky photodetector enhanced by grating-based SPR

We present a near-infrared (NIR) spectrum measurement method using a Schottky photodetector enhanced by surface plasmon resonance (SPR). An Au grating was fabricated on an n-type silicon wafer to form a Schottky barrier and act as an SPR coupler. The resulting photodetector provides wavelength-selec...

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Bibliographic Details
Published inOptics express Vol. 24; no. 22; pp. 25797 - 25804
Main Authors Chen, Wenjing, Kan, Tetsuo, Ajiki, Yoshiharu, Matsumoto, Kiyoshi, Shimoyama, Isao
Format Journal Article
LanguageEnglish
Published United States 31.10.2016
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Summary:We present a near-infrared (NIR) spectrum measurement method using a Schottky photodetector enhanced by surface plasmon resonance (SPR). An Au grating was fabricated on an n-type silicon wafer to form a Schottky barrier and act as an SPR coupler. The resulting photodetector provides wavelength-selective photodetection depending on the SPR coupling angle. A matrix was pre-calculated to describe this characteristic. The spectrum was obtained from this matrix and the measured photocurrents at various SPR coupling angles. Light with single and multiple wavelengths was tested. Comparative measurements showed that our method is able to detect spectra with a wavelength resolution comparable to that of a commercial spectrometer.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.24.025797