X-ray ultramicroscopy using integrated sample cells

The X-ray ultramicroscope (XuM), based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. The right-angle-type integrated sample cells described here expand the capabilities of the XuM technique. The integrated sample cell combines a target, a sp...

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Bibliographic Details
Published inOptics express Vol. 14; no. 17; pp. 7889 - 7894
Main Authors Gao, Dachao, Wilkins, Stephen W, Parry, David J, Gureyev, Tim E, Miller, Peter R, Hanssen, Eric
Format Journal Article
LanguageEnglish
Published United States 21.08.2006
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Summary:The X-ray ultramicroscope (XuM), based on using a scanning electron microscope as host, provides a new approach to X-ray projection microscopy. The right-angle-type integrated sample cells described here expand the capabilities of the XuM technique. The integrated sample cell combines a target, a spacer, a sample chamber, and an exit window in one physical unit, thereby simplifying the instrumentation and providing increased mechanical stability. The XuM imaging results presented here, obtained using such right-angle integrated sample cells, clearly demonstrate the ability to characterize very small features in objects, down to of order 100nm, including their use for dry, wet and even liquid samples.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.14.007889