Surface enhanced ellipsometric contrast (SEEC) basic theory and lambda/4 multilayered solutions

• Published in: Optics express Vol. 15; no. 13; pp. 8329 - 8339
• Main Authors: Ausserré, D, Valignat, M-P
• Format: Journal Article
• Language: English
• Published: United States 25.06.2007
• ISSN: 1094-4087; 1094-4087
• DOI: 10.1364/OE.15.008329

The fundamentals of a new high contrast technique for optical microscopy, named "Surface Enhanced Ellipsometric Contrast" (SEEC), are presented. The technique is based on the association of enhancing contrast surfaces as sample stages and microscope observation between cross polarizers. The surfaces are designed to become anti-reflecting when used in these conditions. They are defined by the simple equation r(p) + r(s) = 0 between their two Fresnel coefficients. Most often, this equation can be met by covering a solid surface with a single lambda/4 layer with a well defined refractive index. A higher flexibility is obtained with multilayer stacks. Solutions with an arbitrary number of all-dielectric lambda/4 layers are derived.