HRTEM and GIXRD studies of CdS nanocrystals embedded in Al2O3 films produced by magnetron RF-sputtering

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Bibliographic Details
Published inJournal of crystal growth Vol. 247; no. 3-4; pp. 371 - 380
Main Authors CONDE, O, ROLO, A. G, GOMES, M. J. M, RICOLLEAU, C, BARBER, D. J
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier 2003
Subjects
Clusters, nanoparticles, and nanocrystalline materials
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Deposition by sputtering
Exact sciences and technology
Materials science
Methods of deposition of films and coatings; film growth and epitaxy
Nanoscale materials and structures: fabrication and characterization
Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals
Physics
Structure of solids and liquids; crystallography
Inorganic compounds
Films
Electron diffraction
Cadmium sulfides
Al. RF-sputtering
Oxides
Crystal growth from vapors
XRD
Sulfides
B1. Nanomaterials
B2. Semiconducting II-VI materials
Nanocrystal
Radiofrequency sputtering
Aluminium oxides
Al. High resolution transmission electron microscopy
Al. Glancing incidence X-ray diffraction
Grazing incidence
Transition element compounds
Crystallinity
Experimental study
High-resolution methods
Magnetrons
Transmission electron microscopy
II-VI semiconductors
Morphology
Fabrication structure relation
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ISSN:0022-0248
1873-5002
DOI:10.1016/S0022-0248(02)01975-9