Losses and group index dispersion in insulator-on-silicon-on-insulator ridge waveguides

We present polarization-dependent optical transmission properties of a completely symmetric silicon-on-insulator (SOI) microphotonic material system. In contrast to typical SOI based photonic materials, here an insulator-on-silicon-on-insulator (IOSOI) material system has been fabricated. This symme...

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Bibliographic Details
Published inOptics express Vol. 18; no. 5; pp. 4590 - 4600
Main Authors Pergande, Daniel, Wehrspohn, Ralf B
Format Journal Article
LanguageEnglish
Published United States 01.03.2010
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Summary:We present polarization-dependent optical transmission properties of a completely symmetric silicon-on-insulator (SOI) microphotonic material system. In contrast to typical SOI based photonic materials, here an insulator-on-silicon-on-insulator (IOSOI) material system has been fabricated. This symmetric structure exhibits average losses between 1510 and 1630 nm of around 0.5 dB/mm for TE and 0.3 dB/mm for TM-polarization. The good transmission for TM-polarization can be explained by the thick insulting cladding layer of 3 microm thickness. Moreover, group index dispersion diagrams are presented and discussed for both polarizations.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.18.004590