Analytical S -Parameter Sensitivity Formula for the Shape Parameters of Dielectric Objects

• Published in: IEEE microwave and wireless components letters Vol. 24; no. 5; pp. 291 - 293
• Main Authors: Dadash, M. Sadegh, Nikolova, Natalia K.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.05.2014; Institute of Electrical and Electronics Engineers
• Subjects: Adjoint-variable method; Applied classical electromagnetism; Applied sciences; Circuit properties; Computation; Computer aided design; Computer science; control theory; systems; Computer simulation; computer-aided design (CAD); Derivatives; Dielectrics; Electric, optical and optoelectronic circuits; electromagnetic analysis; Electromagnetic wave propagation, radiowave propagation; Electromagnetism; electron and ion optics; Electronics; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Mathematical analysis; Mathematical models; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits; Microwave theory and techniques; Microwaves; Permittivity; Physics; Ports (Computers); response Jacobians; Sensitivity analysis; Shape; Software; Volumetric analysis; Sensitivity analysis; Electromagnetism; Computer simulation; Dielectric materials; Adjoint method; Jacobi matrix; Modeling; response Jacobians; Optimization; Finite element method; Adjoint-variable method; electromagnetic analysis; s parameter; Derivative; Microwave circuit; computer-aided design (CAD); Computer aided design
• ISSN: 1531-1309; 1558-1764
• DOI: 10.1109/LMWC.2014.2306891

An exact sensitivity expression is proposed for the computation of S-parameter derivatives with respect to the shape parameters of isotropic dielectric objects. While an exact expression has already been developed for the shape parameters of volumetric metallic objects, to our knowledge, the case of dielectric objects has only been treated with approximations. The proposed expression integrates the field solution on the surfaces of the objects of interest. This solution is already available from the simulation computing the S-parameters. Therefore, it features negligible computational overhead compared with the full-wave simulation. At the same time, it provides the best accuracy for the given numerical field solution. It is validated through the sensitivity analysis of microwave structures simulated by a commercial electromagnetic solver based on the finite-element method.